TMP007 datasheet(48/55 Pages) TI

48 / 55 page

TMP007

SBOS685C – APRIL 2014 – REVISED JULY 2015

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11 Device and Documentation Support

11.1 Device Support

11.1.1 Device Nomenclature

The device performance is characterized by the signal, responsivity, and the noise of the sensor. The sensor

noise can be characterized in terms of the raw sensor voltage, or in terms of a reference system with known

optical transfer function.

Responsivity A measure of the voltage generated by the thermopile as a function of the thermal radiation

incident on the device. The responsivity is measured in V/W. Typically incident radiations are in µW

and sensor output voltages in µV.

Sensor Noise The noise voltage intrinsic to the sensor given in nV. This parameter is conversion-time

dependent.

Noise Equivalent Power (NEP) The smallest thermal power difference that the detector can reliably detect;

measured in nW. The NEP is a function of the sensor noise and the responsivity.

Noise Equivalent Temperature Difference (NETD) The smallest temperature difference the detector can

reliably detect; measured in milliKelvins (mK). The NETD is a function of the sensor noise,

responsivity and the system specific optical path.

For comparison purposes, NETD is given for a reference system without a lens and with an

ideal (nonabsorbing) F/1 lens.

11.2 Documentation Support

11.2.1 Related Documentation

SBOU142 — TMP007 Calibration Guide.

SBOU143 — TMP007 Layout and Assembly Guide.

11.3 Community Resources

The following links connect to TI community resources. Linked contents are provided AS IS by the respective

contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of

Use.

TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration

among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help

solve problems with fellow engineers.

Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and

contact information for technical support.

11.4 Trademarks

E2E is a trademark of Texas Instruments.

All other trademarks are the property of their respective owners.

11.5 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

11.6 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.

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