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MT4LC8M8P4 bảng dữ liệu(PDF) 4 Page - Micron Technology |
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MT4LC8M8P4 bảng dữ liệu(HTML) 4 Page - Micron Technology |
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4 / 22 page ![]() 4 8 Meg x 8 EDO DRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. D20_2.p65 – Rev. 5/00 ©2000, Micron Technology, Inc. 8 MEG x 8 EDO DRAM covers all rows. The CBR REFRESH cycle will invoke the internal refresh counter for automatic RAS# address- ing. Alternatively, RAS#-ONLY REFRESH capability is inherently provided. However, with this method, some compatibility issues may become apparent. For ex- ample, both C2 and P4 versions require 4,096 CBR REFRESH cycles, yet each requires a different number of RAS#-ONLY REFRESH cycles (C2 = 4,096 and P4 = 8,192). JEDEC strongly recommends the use of CBR REFRESH for this device. An optional self refresh mode is also available on the “S” version. The self refresh feature is initiated by performing a CBR REFRESH cycle and holding RAS# LOW for the specified tRASS. The “S” option allows for an extended period of 128ms, or 31.25µs per row for a 4K refresh and 15.625µs per row for an 8K refresh, when using a distributed CBR REFRESH. This refresh rate can be applied during normal operation, as well as during a standby or battery backup mode. The self refresh mode is terminated by driving RAS# HIGH for a minimum time of tRPS. This delay allows for the completion of any internal refresh cycles that may be in process at the time of the RAS# LOW-to-HIGH transition. If the DRAM controller uses a distributed CBR refresh sequence, a burst refresh is not required upon exiting self refresh. However, if the DRAM controller utilizes a RAS#-ONLY or burst CBR refresh sequence, all 1,024 rows must be refreshed using a minimum tRC refresh rate prior to resuming normal operation. EDO PAGE MODE (continued) other cycles, the outputs are disabled at tOFF time after RAS# and CAS# are HIGH or at tWHZ after WE# transi- tions LOW. The tOFF time is referenced from the rising edge of RAS# or CAS#, whichever occurs last. WE# can also perform the function of disabling the output drivers under certain conditions, as shown in Figure 2. EDO-PAGE-MODE operations are always initiated with a row address strobed in by the RAS# signal, followed by a column address strobed in by CAS#, just like for single location accesses. However, subse- quent column locations within the row may then be accessed at the page mode cycle time. This is accom- plished by cycling CAS# while holding RAS# LOW and entering new column addresses with each CAS# cycle. Returning RAS# HIGH terminates the EDO-PAGE-MODE operation. DRAM REFRESH The supply voltage must be maintained at the speci- fied levels, and the refresh requirements must be met in order to retain stored data in the DRAM. The refresh requirements are met by refreshing all 8,192 rows (P4) or all 4,096 rows (C2) in the DRAM array at least once every 64ms. The recommended procedure is to execute 4,096 CBR REFRESH cycles, either uniformly spaced or grouped in bursts, every 64ms. The MT4LC8M8P4 in- ternally refreshes two rows for every CBR cycle, whereas the MT4LC8M8C2 refreshes one row for every CBR cycle. So with either device, executing 4,096 CBR cycles V V IH IL CAS# V V IH IL RAS# V V IH IL ADDR ROW COLUMN (A) DON’T CARE UNDEFINED V V IH IL WE# V V IOH IOL OPEN DQ tWPZ The DQs go to High-Z if WE# falls and, if tWPZ is met, will remain High-Z until CAS# goes LOW with WE# HIGH (i.e., until a READ cycle is initiated). V V IH IL OE# VALID DATA (B) t WHZ WE# may be used to disable the DQs to prepare for input data in an EARLY WRITE cycle. The DQs will remain High-Z until CAS# goes LOW with WE# HIGH (i.e., until a READ cycle is initiated). t WHZ COLUMN (D) VALID DATA (A) COLUMN (B) COLUMN (C) INPUT DATA (C) Figure 2 WE# CONTROL of DQs |
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