PIC17C752-08SLASHCL datasheet(235/328 Pages) MICROCHIP

235 / 328 page

Preliminary

DS30289A-page 235

PIC17C7XX

20.0

PIC17C7 MXX ELECTRICAL CHARACTERISTICS

Absolute Maximum Ratings †

Ambient temperature under bias............................................................................................................. -55˚C to +125˚C

Storage temperature .............................................................................................................................. -65˚C to +150˚C

Voltage on VDD with respect to VSS ............................................................................................................. 0V to +7.5V

Voltage on MCLR with respect to VSS (Note 2).......................................................................................... -0.3V to +14V

Voltage on RA2 and RA3 with respect to VSS............................................................................................ -0.3V to +8.5V

Voltage on all other pins with respect to VSS .................................................................................... -0.3V to VDD + 0.3V

Total power dissipation (Note 1) ................................................................................................................................1.0W

Maximum current out of VSS pin(s) - total (@ 70˚C) ............................................................................................500 mA

Maximum current into VDD pin(s) - total (@ 70˚C) ...............................................................................................500 mA

Input clamp current, IIK (VI < 0 or VI > VDD)..........................................................................................................

±20 mA

Output clamp current, IOK (VO < 0 or VO > VDD) ...................................................................................................

±20 mA

Maximum output current sunk by any I/O pin (except RA2 and RA3).....................................................................35 mA

Maximum output current sunk by RA2 or RA3 pins ................................................................................................60 mA

Maximum output current sourced by any I/O pin ....................................................................................................20 mA

Maximum current sunk by PORTA and PORTB (combined) .................................................................................150 mA

Maximum current sourced by PORTA and PORTB (combined)............................................................................100 mA

Maximum current sunk by PORTC, PORTD and PORTE (combined) ..................................................................150 mA

Maximum current sourced by PORTC, PORTD and PORTE (combined).............................................................100 mA

Maximum current sunk by PORTF and PORTG (combined) ................................................................................150 mA

Maximum current sourced by PORTF and PORTG (combined) ...........................................................................100 mA

Maximum current sunk by PORTH and PORTJ (combined) .................................................................................150 mA

Maximum current sourced by PORTH and PORTJ (combined)............................................................................100 mA

Note 1: Power dissipation is calculated as follows: Pdis = VDD x {IDD -

∑ IOH} + ∑ {(VDD-VOH) x IOH} + ∑(VOL x IOL)

Note 2: Voltage spikes below VSS at the MCLR pin, inducing currents greater than 80 mA, may cause latch-up. Thus,

a series resistor of 50-100

Ω should be used when applying a "low" level to the MCLR pin rather than pulling

this pin directly to VSS.

† NOTICE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent dam-

age to the device. This is a stress rating only and functional operation of the device at those or any other

conditions above those indicated in the operation listings of this speciﬁcation is not implied. Exposure to

maximum rating conditions for extended periods may affect device reliability.

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