TLP measurements

AN4022

12/15

DocID022589 Rev 2

4

TLP measurements

A commonly used method to probe the dynamic characteristic of a TVS is the TLP

(transmission line pulse). This uses square pulses with a duration between 75 ns to 200 ns

with fast rise times of few nanoseconds. The equipment required is specific and expensive

and is dedicated to the characterization of the ESD robustness of protection devices,

especially for integrated circuit I/O’s. The equipment is usually limited to 10 A in maximum

current level (sometimes 20 A).

It is interesting to compare the results obtained by our method and the TLP method.

In Figure 18 and Figure 19, TLP measurements have been made on an ESDAULC6-1U2 up

to 10 A, on the breakdown and forward area. The characteristics obtained by the triangular

pulse are superimposed in green. There is little difference between the two results.

Figure 18. TLP measurements compared with triangular waveform (breakdown

polarity)

It2 = 9.6618 A

Issb = 9.5235 A

Vt1 = 9.1069 V

Vh = 9.1069 V

Ron = 1.2246 ohm

It2

Vt1

Breakdown

Triangular waveform

TLP

DUT voltage (V)

Leakage current (A)

10

9

8

7

6

5

4

3

2

1

0

0

5

10

15

20

10

-12

10

-10

10

-8

10

-6

10

-4

10

-2