Application EMC immunity

AN4075

18/23

Doc ID 022954 Rev 1

4.2.2

Test signal

According the IEC 61000-4-4

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Polarity: positive/negative

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Burst duration: 15 ms ± 20% at 5 kHz

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Burst period: 300 ms ± 20%

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Duration time: 1 minute

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Applied to: L+, C/Q, I/Q and L- lines through capacitive clamp

4.2.3

Test setup

The EFT signal was coupled to the supply voltage lines through the capacitive coupling

clamp which corresponds to approximately 150 pF.

The application supply voltage was provided by two 12 V lead battery cells.

Earth (reference plain) was connected to the application.

4.2.4

Conclusion

The application is immune against fast transient burst signals.

Burst applied to the IO-Link communication lines has no influence on the stability of the

L6360 internal registers.

4.3

EMC IEC 61000-4-5 surge immunity test

4.3.1

Test conditions

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Supply voltage: 23 V (approximately)

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Ambient temperature: 23 °C

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L+, C/Q configured as mentioned in Table 6 to Table 8

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Register values - see Section 4.1

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L+, C/Q, I/Q lines left floating

Table 5.

Application EFT (burst) immunity, applied to IO-Link lines

(L+, C/Q, I/Q, L-)

Polarity

EFT test signal amplitude, test result

1 kV

2 kV

3 kV

4 kV

Positive (+)

1.

The L6360 internal registers state stable; logic interface state changes not evaluated.

A(1)

A(1)

A(1)

Negative (-)

A(1)

A(1)

A(1)

A(1)