The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica-

tion and design information only. No guarantee is implied.

7-16

HA5340

Test Circuits

HOLD STEP ERROR AND DROOP RATE

HOLD STEP ERROR

DROOP RATE TEST

1. Observe the voltage ‘‘droop’’,

∆V

2. Measure the slope of the output during hold,

∆V

3. Droop can be positive or negative - usually to one rail or the other

not to GND.

HOLD MODE FEED THROUGH ATTENUATION

Feedthrough in dB = 20 Log

14

2

1

7

11

N.C.

-INPUT

+INPUT

S/H CONTROL

CONTROL

INPUT

S/H

OUTPUT

HA-5340

8

N.C.

HOLD (4.0V)

SAMPLE (0V)

S/H CONTROL

V

O

∆V

O

∆T

S/H CONTROL

HOLD (4.0V)

SAMPLE (0V)

ANALOG

MUX OR

SWITCH

S/H

CONTROL

REF

COM

SUPPLY

GND

+IN

-IN

TO

SIGNAL

GND

TO

SUPPLY

COMMON

N.C.

OUT

7

13

11

6

1

2

14

-V

+V

S/H CONTROL

INPUT

95

HA-5340

200kHz

SINE WAVE

Spec Number

511117-883