7-11

Specifications HA5340/883

TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS

PARAMETER

SYMBOL

CONDITIONS

NOTES

TEMPERATURE

LIMITS

UNITS

MIN

MAX

Hold Mode Feedthrough

1

-

-70

dB

Sample Mode Noise

Voltage

1

-

335

µV

RMS

Hold Mode Noise

Voltage

1

-

100

µV

RMS

Input Capacitance

1

5

pF

Input Resistance

1

-

M

Ω

0.1% Acquisition Time

to 10V Step

1

-

600

ns

Total Harmonic

Distortion Hold Mode

1

-

-50

dBc

1

-

-47

dBc

Total Harmonic

Distortion Sample Mode

1

-

-60

dBc

1

-

-49

dBc

NOTE:

1. The parameters listed in this table are controlled via design or process parameters and are not directly tested. These parameters are

characterized upon initial design release and upon design changes which would affect these characteristics.

TABLE 4. ELECTRICAL TEST REQUIREMENTS

MIL-STD-883 TEST REQUIREMENTS

SUBGROUPS (SEE TABLES 1 AND 2)

Interim Electrical Parameters (Pre Burn-In)

-

Final Electrical Test Parameters

1(Note 1), 2, 3, 4, 5, 6

Group A Test Requirements

1, 2, 3, 4, 5, 6

Groups C and D Endpoints

1

NOTE:

1. PDA applies to Subgroup 1 only. No other subgroups are included in PDA.

CAUTION: These devices are sensitive to electronic discharge. Proper IC handling procedures should be followed.

Spec Number

511117-883