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DS32EL0421 bảng dữ liệu(PDF) 8 Page - Texas Instruments

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DS32EL0421 bảng dữ liệu(HTML) 8 Page - Texas Instruments

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DS32EL0421, DS32ELX0421
SNLS282F – MAY 2008 – REVISED APRIL 2013
www.ti.com
LVDS Timing Specifications (continued)
Over recommended operating supply and temperature ranges unless otherwise specified.
(1) (2)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
tCIT
TxCLKIN Transition Time
See Figure 2
0.5
1.0
3.0
ns
See (3)
tXIT
TxIN Transition Time
0.15
3
ns
tCIH
TxCLKIN High Time
See Figure 3
0.7T
T
1.3T
ns
tCIL
TxCLKIN Low Time
0.7T
T
1.3T
ns
tSTC
TxIN Setup to TxCLKIN
-550
ps
tHTC
TxIN Hold to TxCLKIN
900
ps
tLVDLS
LVDS Input Clock Delay Step Size
Programmable through the SMBus,
100
ps
register 30'h
Default setting = 011'b [7:5]
(3)
Parameter is ensured by characterization and is not tested at production.
CML Electrical Specifications
Over recommended operating supply and temperature ranges unless otherwise specified.
(1) (2) (3)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
ROT
Output Terminations
On chip termination from TxOUT0/1 +
40
50
60
Ω
and TxOUT0/1 - to VDD25
50
Ω mode
75
Ω mode
60
75
90
Ω
ΔROT
Mismatch in Output Termination Resistors
5
%
VOD
Output Differential Voltage Swing
Based on VOD_CTRL = 9.1 k
Ω
1175
1350
1450
mVP-P
(1)
The Electrical Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except as
otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and
are not ensured.
(2)
Current into device pins is defined as positive. Current out of device pins is defined as negative. All voltages are referenced to ground
except VOD and ΔVOD.
(3)
Typical values represent most likely parametric norms for VCC = +3.3V and TA = +25°C, and at the Recommended Operation Conditions
at the time of product characterization and are not ensured.
CML Timing Specifications
Over recommended operating supply and temperature ranges unless otherwise specified.
(1) (2)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
LR
Line Rate
Tested with alternating 1-0 pattern.
1.25
3.125
Gbps
tOS
Output Overshoot
See (3)
10
%
tR
Differential Low to High Transition Time
See (3)
60
90
ps
tF
Differential High to Low Transition Time
60
90
ps
tRFMM
Mismatch in Rise/Fall Time
See (3)
15
ps
tDE
De-emphasis width
Measured from zero-crossing at rising
1
UI
edge to 80% of VOD from zero-
crossing at falling edge. TDE is
measured at the High setting during
test.
tBIT
Serializer Bit Width
0.2 x
ns
tCIP
tSD
Serializer Propagation Delay – Latency
Depends on mode — see Table 3
(10 –
ns
14) T+
5.5
(1)
The Electrical Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except as
otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and
are not ensured.
(2)
Typical values represent most likely parametric norms for VCC = +3.3V and TA = +25°C, and at the Recommended Operation Conditions
at the time of product characterization and are not ensured.
(3)
Parameter is ensured by characterization and is not tested at production.
8
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Copyright © 2008–2013, Texas Instruments Incorporated
Product Folder Links: DS32EL0421 DS32ELX0421



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