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LP3982 bảng dữ liệu(PDF) 3 Page - Texas Instruments

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tên linh kiện LP3982
Giải thích chi tiết về linh kiện  LP3982 Micropower, Ultra Low-Dropout, Low-Noise, 300 mA CMOS Regulator
PDF  23 Pages
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Trang chủ  http://www.ti.com
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LP3982 bảng dữ liệu(HTML) 3 Page - Texas Instruments

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OFF
THERMAL
PROTECTION
1.25V
BANDGAP
FAST
START-UP
CIRCUIT
CURRENT
LIMIT
FAULT
COMPARATORS
R1
R2
VIN
VO
SET
CC
SHDN
FAULT
GND
ERROR
AMP
+
-
LP3982
www.ti.com
SNVS185D – FEBRUARY 2002 – REVISED APRIL 2013
ELECTRICAL CHARACTERISTICS (continued)
Unless otherwise specified, all limits specified for VIN = VO +0.5V
(1), V
SHDN = VIN, CIN = COUT = 2.2μF, CCC = 33nF, TJ = 25°C.
Boldface limits apply for the operating temperature extremes:
−40°C and 85°C.
Symbol
Parameter
Conditions
Min(2)
Typ(3)
Max(2)
Units
VDO
Dropout Voltage(1)(4)
IOUT = 1 mA
0.4
IOUT = 200 mA
80
220
mV
IOUT = 300 mA
120
ΔVO
Line Regulation
IOUT = 1 mA, (VO + 0.5V) ≤ VI ≤ 6V
(1)
−0.1
0.01
0.1
%/V
Load Regulation
100
μA ≤ IOUT ≤ 300 mA
0.002
%/mA
en
Output Voltage Noise
IOUT = 10 mA, 10 Hz ≤ f ≤ 100 kHz
37
μVRMS
Output Voltage Noise Density
10 Hz
≤ f ≤ 100 kHz, COUT = 10 μF
190
nV/
√Hz
VSHDN
SHDN Input Threshold
VIH, (VO + 0.5V) ≤ VI ≤ 6V
(1)
2
V
VIL, (VO + 0.5V) ≤ VI ≤ 6V
(1)
0.4
ISHDN
SHDN Input Bias Current
SHDN = GND or IN
0.1
100
nA
ISET
SET Input Leakage
SET = 1.3V, Adjust Version Only(5)
0.1
2.5
nA
VFAULT
FAULTDetection Voltage
VO ≥ 2.5V, IOUT = 200 mA
(6)
120
280
mV
FAULT Output Low Voltage
ISINK = 2 mA
0.115
0.25
V
IFAULT
FAULT Off-Leakage Current
FAULT = 3.6V, SHDN = 0V
0.1
100
nA
TSD
Thermal Shutdown Temperature
160
°C
Thermal Shutdown Hysteresis
10
TON
Start-Up Time
COUT = 10 μF, VO at 90% of Final
120
μs
Value
(4)
Dropout voltage is measured by reducing VIN until VO drops 100mV from its nominal value at VIN -VO = 0.5V. Dropout Voltage does not
apply to the 1.8 version.
(5)
The SET pin is not externally connected for the fixed versions.
(6)
The FAULT detection voltage is specified for the input to output voltage differential at which the FAULT pin goes active low.
FUNCTIONAL BLOCK DIAGRAM
Figure 1.
Copyright © 2002–2013, Texas Instruments Incorporated
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