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STM32F100C bảng dữ liệu(PDF) 86 Page - STMicroelectronics |
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STM32F100C bảng dữ liệu(HTML) 86 Page - STMicroelectronics |
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86 / 98 page ![]() Electrical characteristics STM32F100xC, STM32F100xD, STM32F100xE 86/98 Doc ID 15081 Rev 7 Figure 37. 12-bit buffered /non-buffered DAC 1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the DAC_CR register. Offset(1) Offset error (difference between measured value at Code (0x800) and the ideal value = VREF+/2) ±10 mV Given for the DAC in 12-bit configuration ±3 LSB Given for the DAC in 10-bit at VREF+ = 3.6 V ±12 LSB Given for the DAC in 12-bit at VREF+ = 3.6 V Gain error(1) Gain error ±0.5 % Given for the DAC in 12-bit configuration tSETTLING (1) Settling time (full scale: for a 10-bit input code transition between the lowest and the highest input codes when DAC_OUT reaches final value ±1LSB 34 µs CLOAD ≤ 50 pF, RLOAD ≥ 5 kΩ Update rate(1) Max frequency for a correct DAC_OUT change when small variation in the input code (from code i to i+1LSB) 1MS/s CLOAD ≤ 50 pF, RLOAD ≥ 5 kΩ tWAKEUP (1) Wakeup time from off state (Setting the ENx bit in the DAC Control register) 6.5 10 µs CLOAD ≤ 50 pF, RLOAD ≥ 5 kΩ input code between lowest and highest possible ones. PSRR+ (1) Power supply rejection ratio (to VDDA) (static DC measurement –67 –40 dB No RLOAD, CLOAD = 50 pF 1. Preliminary values. 2. Quiescent mode refer to the state of the DAC keeping steady value on the output, so no dynamic consumption is involved. Table 55. DAC characteristics (continued) Symbol Parameter Min Typ Max(1) Unit Comments R LOAD C LOAD Buffered/Non-buffered DAC DACx_OUT Buffer(1) 12-bit digital to analog converter ai17157 |
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