AD8331ARQZ-R7 datasheet(20/56 Pages) AD

20 / 56 page

AD8331/AD8332/AD8334

Rev. G | Page 20 of 56

TEST CIRCUITS

MEASUREMENT CONSIDERATIONS

Figure 55 through Figure 68 show typical measurement

configurations and proper interface values for measurements

with 50 Ω conditions.

Short-circuit input noise measurements are made as shown in

Figure 62. The input-referred noise level is determined by

dividing the output noise by the numerical gain between Point A

and Point B and accounting for the noise floor of the spectrum

analyzer. The gain should be measured at each frequency of

interest and with low signal levels because a 50 Ω load is driven

directly. The generator is removed when noise measurements

are made.

LMD

18nF

22pF

FB*

120nH

*FERRITE BEAD

OUT

0.1µF

DUT

NETWORK ANALYZER

0.1µF

28Ω

237Ω

28Ω

1:1

50Ω

270Ω

INH

237Ω

0.1µF

Figure 55. Test Circuit—Gain and Bandwidth Measurements

10kΩ

LMD

18nF

22pF

FB*

120nH

*FERRITE BEAD

OUT

0.1µF

VGN

DUT

NETWORK ANALYZER

0.1µF

28Ω

237Ω

28Ω

1:1

50Ω

INH

237Ω

0.1µF

Figure 56. Test Circuit—Frequency Response for Various Matched Source Impedances

LMD

22pF

FB*

120nH

*FERRITE BEAD

OUT

0.1µF

VGN

DUT

NETWORK ANALYZER

0.1µF

28Ω

237Ω

28Ω

1:1

50Ω

INH

237Ω

0.1µF

Figure 57. Test Circuit—Frequency Response for Unterminated LNA, RS = 50 Ω

AD8331ARQZ-R7 bảng dữ liệu(PDF) 20 Page - Analog Devices

AD8331ARQZ-R7 bảng dữ liệu(HTML) 20 Page - Analog Devices

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56

bảng dữ liệu tải về

Link URL