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RT8167B bảng dữ liệu(PDF) 19 Page - Richtek Technology Corporation |
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RT8167B bảng dữ liệu(HTML) 19 Page - Richtek Technology Corporation |
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19 / 38 page ![]() RT8167B 19 DS8167B-00 October 2011 www.richtek.com Note 1. Stresses listed as the above “Absolute Maximum Ratings” may cause permanent damage to the device. These are for stress ratings. Functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may remain possibility to affect device reliability. Note 2. θJA is measured in the natural convection at TA = 25°C on a high effective thermal conductivity four-layer test board of JEDEC 51-7 thermal measurement standard. The measurement case position of θJC is on the exposed pad of the package. Note 3. Devices are ESD sensitive. Handling precaution is recommended. Note 4. The device is not guaranteed to function outside its operating conditions. Note 5. Guaranteed by design. |
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