SPC560D40L1 datasheet(51/82 Pages) STMICROELECTRONICS

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SPC560D30x, SPC560D40x

Electrical characteristics

Doc ID 16315 Rev 5

51/82

Therefore it is recommended that the user apply EMC software optimization and

prequalification tests in relation with the EMC level requested for his application.

●

Software recommendations

− The software flowchart must include the management of

runaway conditions such as:

–

Corrupted program counter

–

Unexpected reset

–

Critical data corruption (control registers...)

●

Prequalification trials

− Most of the common failures (unexpected reset and program

counter corruption) can be reproduced by manually forcing a low state on the reset pin

or the oscillator pins for 1 second.

To complete these trials, ESD stress can be applied directly on the device. When

unexpected behavior is detected, the software can be hardened to prevent

unrecoverable errors occurring (see the application note Software Techniques For

Improving Microcontroller EMC Performance (AN1015)).

4.12.2

Electromagnetic interference (EMI)

The product is monitored in terms of emission based on a typical application. This emission

test conforms to the IEC 61967-1 standard, which specifies the general conditions for EMI

measurements.

4.12.3

Absolute maximum ratings (electrical sensitivity)

Based on two different tests (ESD and LU) using specific measurement methods, the

product is stressed in order to determine its performance in terms of electrical sensitivity.

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts * (n + 1) supply pin). This test

Table 33.

EMI radiated emission measurement(1)(2)

Symbol C

Parameter

Conditions

Value

Unit

Min

Typ Max

—

SR — Scan range

—

0.150

—

1000 MHz

fCPU SR — Operating frequency

—

MHz

VDD_LV SR — LV operating voltages

—

1.28

—

SEMI CC T Peak level

VDD = 5V, TA =25°C,

LQFP100 package

Test conforming to IEC 61967-2,

fOSC = 8 MHz/fCPU = 48 MHz

No PLL frequency

modulation

—

dBµV

± 2% PLL frequency

modulation

——

14(3) dBµV

EMI testing and I/O port waveforms per IEC 61967-1, -2, -4.

For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your local

marketing representative.

All values need to be confirmed during device validation.

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