ISO7240CF, ISO7240C, ISO7240M

ISO7241C, ISO7241M

ISO7242C, ISO7242M

www.ti.com

SLLS868N

– SEPTEMBER 2007 – REVISED JANUARY 2012

over recommended operating conditions (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Propagation delay

See Figure 1

20

50

ISO724xC

ns

PWD

3

Propagation delay

ISO724xM

12

29

ns

PWD

1

2

ISO724xC

10

ns

ISO724xM

0

5

ISO724xC

3

ns

ISO724xM

0

1

Output signal rise time

2

See Figure 1

ns

Output signal fall time

2

Propagation delay, high-level-to-high-impedance output

15

20

Propagation delay, high-impedance-to-high-level output

15

20

See Figure 2

ns

Propagation delay, low-level-to-high-impedance output

15

20

Propagation delay, high-impedance-to-low-level output

15

20

Failsafe output delay time from input power loss

See Figure 3

18

μs

Wake time from input disable

See Figure 4

15

μs

150 Mbps PRBS NRZ data

Peak-to-peak eye-pattern jitter

ISO724xM

input, Same polarity input on

1

ns

all channels, See Figure 6

(1)

Also known as pulse skew

(2)

operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.

(3)

same direction while driving identical specified loads.

Copyright

© 2007–2012, Texas Instruments Incorporated

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