STM32F051K4 datasheet(69/104 Pages) STMICROELECTRONICS

69 / 104 page

Electrical characteristics

STM32F051x

70/105

Doc ID 022265 Rev 3

All I/Os are CMOS and TTL compliant (no software configuration required). Their

characteristics cover more than the strict CMOS-technology or TTL parameters. The

coverage of these requirements is shown in Figure 16 and Figure 17 for standard I/Os, and

in Figure 18 and Figure 19 for 5 V tolerant I/Os.

Ilkg

Input leakage current (3)

VSS ≤ VIN ≤ VDD

I/O TC, FT and FTf

±0.1

µA

VSS ≤ VIN ≤ VDD

2 V

≤ VDD ≤ VDDA ≤ 3.6 V

I/O TTa used in digital

mode

±0.1

VIN= 5 V

I/O FT and FTf

VIN= 3.6 V,

2 V

≤ VDD ≤ VIN

VDDA = 3.6 V

I/O TTa used in digital

mode

VSS ≤ VIN ≤ VDDA

2 V

≤ VDD ≤ VDDA ≤ 3.6 V

I/O TTa used in analog

mode

±0.2

RPU

Weak pull-up equivalent

resistor(4)

VIN = VSS

RPD

Weak pull-down

equivalent resistor(4)

VIN = VDD

CIO

I/O pin capacitance

To sustain a voltage higher than VDD+0.3 the internal pull-up/pull-down resistors must be disabled.

Hysteresis voltage between Schmitt trigger switching levels. Data based on characterization, not tested in production.

Leakage could be higher than max. if negative current is injected on adjacent pins.

Pull-up and pull-down resistors are designed with a true resistance in series with a switchable PMOS/NMOS. This

MOS/NMOS contribution to the series resistance is minimum (~10% order)

Table 50.

I/O static characteristics (continued)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

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