TIBPLS506ACFN datasheet(8/16 Pages) TI1

8 / 16 page

TIBPLS506AC

× 97 × 8 FIELD-PROGRAMMABLE LOGIC SEQUENCER

SRPS003C – D3090, DECEMBER 1987 – REVISED NOVEMBER 1995

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

glossary — timing model

tpd(1) — Maximum time interval from the time a signal edge is received at any input pin to the time any logically

affected combinational output pin delivers a response.

tpd(2) — Maximum time interval from a positive edge on the clock input pin to data delivery on the output pin

corresponding to any output SR register.

tpd(3) — Maximum time interval from the positive edge on the clock input pin to the response on any logically

affected combinational configured output (at the pin), where data origin is any internal SR register.

tpd(b) — Maximum time interval from the time a signal edge is received at any input pin to the time any logically

affected combinational output pin delivers a response, where data passes through a C-array once

before reaching the affected output.

tpd(c) —

Maximum time interval from the positive edge on the clock input pin to the response on any logically

affected combinational configured output (at the pin), where data origin is any internal SR register

and data passes once through a C-array before reaching an affected output.

tsu(1) —

Minimum time interval that must be allowed between the data edge on any dedicated input and the

active clock edge on the clock input pin when data affects the S or R line of any output SR register.

tsu(2) —

Minimum time interval that must be allowed between the data edge on any dedicated input and the

active clock edge on the clock input pin when data affects the S or R line of any internal SR register.

tsu(a) —

Minimum time interval that must be allowed between the data edge on any dedicated input and the

active clock edge on the clock input pin when data passes once through a C-array before reaching

an affected S or R line on any internal SR register.

tsu(b) —

Minimum time interval that must be allowed between the data edge on any dedicated input and the

active clock edge on the clock input pin when data passes once through a C-array before reaching

an affected S or R line on any output SR register.

tmin(1) — Minimum clock period (or 1/[maximum frequency]) that the device will accommodate when using

feedback from any internal SR register or counter bit to feed the S or R line of any output SR register.

tmin(2) — Minimum clock period (or 1/[maximum frequency]) that the device will accommodate when using

feedback from any internal SR register to feed the S or R line of any internal SR register.

tmin(3) — Minimum clock period (or 1/[maximum frequency]) that the device will accommodate when using

feedback from any internal SR register to feed the S or R line of any internal SR register and data

passes once through a C-array before reaching an affected S or R line on any internal SR register.

tmin(c) — Minimum clock period (or 1/[maximum frequency]) that the device will accommodate when using

feedback from any internal SR register to feed the S or R line of any output SR register and data

passes once through a C-array before reaching an affected S or R line on any output SR register.

TIBPLS506ACFN bảng dữ liệu(PDF) 8 Page - Texas Instruments

TIBPLS506ACFN bảng dữ liệu(HTML) 8 Page - Texas Instruments

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

bảng dữ liệu tải về

Link URL