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STM8L151C4U6 bảng dữ liệu(PDF) 79 Page - STMicroelectronics

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Giải thích chi tiết về linh kiện  8-bit ultralow power MCU, up to 32 KB Flash, 1 KB Data EEPROM RTC, LCD, timers, USART, I2C, SPI, ADC, DAC, comparators
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STM8L151xx, STM8L152xx
Electrical parameters
Doc ID 15962 Rev 5
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9.3.4
Clock and timing characteristics
HSE external clock (HSEBYP = 1 in CLK_ECKCR)
Subject to general operating conditions for VDD and TA.
LSE external clock (LSEBYP=1 in CLK_ECKCR)
Subject to general operating conditions for VDD and TA.
Table 27.
Current consumption under external reset
Symbol
Parameter
Conditions
Typ
Unit
IDD(RST)
Supply current under
external reset (1)
All pins are externally
tied to VDD
VDD = 1.8 V
48
µA
VDD = 3 V
76
VDD = 3.6 V
91
1.
All pins except PA0, PB0 and PB4 are floating under reset. PA0, PB0 and PB4 are configured with pull-up under reset.
Table 28.
HSE external clock characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
fHSE_ext
External clock source
frequency(1)
1.
Guaranteed by design, not tested in production.
116
MHz
VHSEH
(2)
2.
Data based on characterization results, not tested in production.
OSC_IN input pin high level
voltage
0.7 x VDD
VDD
V
VHSEL
(2)
OSC_IN input pin low level
voltage
VSS
0.3 x VDD
Cin(HSE)
OSC_IN input
capacitance(1)
2.6
pF
ILEAK_HSE
OSC_IN input leakage
current
VSS < VIN < VDD
±1
µA
Table 29.
LSE external clock characteristics
Symbol
Parameter
Min
Typ
Max
Unit
fLSE_ext
External clock source frequency(1)
32.768
kHz
VLSEH
(2)
OSC32_IN input pin high level voltage
0.7 x VDD
VDD
V
VLSEL
(2)
OSC32_IN input pin low level voltage
VSS
0.3 x VDD
Cin(LSE)
OSC32_IN input capacitance(1)
0.6
pF
ILEAK_LSE
OSC32_IN input leakage current
±1
µA
1.
Guaranteed by design, not tested in production.
2.
Data based on characterization results, not tested in production.



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