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SPMCK16Z4MPV16 bảng dữ liệu(PDF) 177 Page - Freescale Semiconductor, Inc |
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SPMCK16Z4MPV16 bảng dữ liệu(HTML) 177 Page - Freescale Semiconductor, Inc |
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177 / 500 page ![]() M68HC16 Z SERIES SYSTEM INTEGRATION MODULE USER’S MANUAL 5-71 5.10.3 Data Registers A write to the port E and port F data registers (PORTE[0:1] and PORTF[0:1]) is stored in an internal data latch, and if any pin in the corresponding port is configured as an output, the value stored for that bit is driven out on the pin. A read of a data register returns the value at the pin only if the pin is configured as a discrete input. Otherwise, the value read is the value stored in the register. Both data registers can be accessed in two locations and can be read or written at any time. 5.11 Factory Test The test submodule supports scan-based testing of the various MCU modules. It is in- tegrated into the SIM to support production test. Test submodule registers are intend- ed for Freescale use only. Register names and addresses are provided in APPENDIX D REGISTER SUMMARY to show the user that these addresses are occupied. The QUOT pin is also used for factory test. Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com |
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