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BQ76PL536PAPR bảng dữ liệu(PDF) 3 Page - Texas Instruments

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bq76PL536
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SLUSA08A – DECEMBER 2009 – REVISED JULY 2010
PIN
TYPE(1)
DESCRIPTION
NO.
NAME
7
VC3
AI
Sense voltage input terminal for the positive terminal of the third cell
8
CB3
O
Cell-balance control output
9
VC2
AI
Sense voltage input terminal for the positive terminal of the second cell
10
CB2
O
Cell-balance control output
11
VC1
AI
Sense voltage input terminal for positive terminal of the first cell
12
CB1
O
Cell-balance control output
13
VC0
AI
Sense-voltage input terminal for negative terminal of first cell (VSS)
14
VSS1
P
VSS
15
AGND
AI
Internal analog VREF (–)
16
VREF
P
Internal analog voltage reference (+), requires 10-µF, low-ESR ceramic capacitor to AGND for stability
17
LDOA
P
Internal analog 5-V LDO bypass connection, requires 2.2-µF ceramic capacitor for stability
18
LDOD1
P
Internal digital 5-V LDO bypass connection 1, requires 2.2-µF ceramic capacitor for stability. This pin is tied
internally to LDOD2. This pin should be tied to LDOD2 externally.
19
TS1–
AI
Differential temperature sensor input
20
TS1+
AI
Differential temperature sensor input
21
CONV_S
I
Input from the adjacent lower bq76PL536 to initiate a conversion
22
DRDY_S
OD
Current-mode output indicating conversion data is ready to the next lower bq76PL536
23
ALERT_S
OD
Current-mode output indicating a system status change to the next lower bq76PL536
24
FAULT_S
OD
Current-mode output
25
VSS2
P
VSS
26
SCLK_S
I
Current-mode input SPI clock from the next-lower bq76PL536
27
SDO_S
OD
Current-mode output for SPI data to the next-lower bq76PL536
28
SDI_S
I
Current-mode input for SPI data from the next-lower bq76PL536
29
CS_S
I
Current-mode input SPI chip-select (slave-select) from the next-lower bq76PL536
30
NC
–
No connection
31
AUX
O
Switched 1-mA limited output from REG50
32
REG50
P
5-V user LDO output, requires 2.2-µF ceramic capacitor for stability
33
VSS3
P
VSS
34
VSS4
P
VSS
35
VSS5
P
VSS
36
CONV_H
I
Host-to-device interface – initiates a synchronous conversion. Pin has 250-nA internal sink to VSS.
37
DRDY_H
O
Host-to-device interface – conversion complete, data-ready indication
38
ALERT_H
O
Host-to-device interface – ALERT condition detected in this or higher (North) device
39
FAULT_H
O
Host-to-device interface – FAULT condition detected in this or higher (North) device
40
SCLK_H
I
Host-to-device interface – SPI clock from host
41
SDO_H
O
Host-to-device interface – data from device to host (host MISO signal), 3-state pin, 250-nA internal pullup
42
SDI_H
I
Host-to-device interface – data from host to device (host MOSI signal)
43
CS_H
I
Host-to-device interface – active-low chip select from host. Internal 100-k
Ω pullup resistor
44
HSEL
I
Host interface enable, 0 = enable, 1 = disable
45
GPIO
IOD
Digital open-drain I/O. A 10 k
Ω–2-MΩ pullup is recommended.
46
LDOD2
P
Internal digital 5-V LDO bypass connection 2, requires 2.2-µF ceramic capacitor for stability. This pin is tied
internally to LDOD1. This pin should be tied to LDOD1 externally.
47
GPAI–
AI
General-purpose (differential) analog input, connect to VSS if unused.
48
GPAI+
AI
General-purpose (differential) analog input, connect to VSS if unused.
49
VSS6
P
VSS
50
TEST
I
Factory Test pin. Connect to VSS in user circuitry. This pin includes ~100K internal pull-down
51
NC
–
No connect
52
CS_N
OD
Current-mode output used to select the next-higher bq76PL536 for SPI communication
Copyright © 2009–2010, Texas Instruments Incorporated
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3
Product Folder Link(s) :bq76PL536



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