(8)

Refers to the minimum time after which the recognition of negative edge is possible after VTH has been reached on the preceding

rising edge.

(9)

Data retention time is degraded as TA increases. Long-term storage at elevated temperatures is not recommended.

5.7 Functional Tests

Over operating free-air temperature range and VPUP = 3.3V and 5V (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Multi- target bus

Any TMF0020 must be able to communicate in a network where

there are multiple target devices. An example configuration of 3

target devices (including the DUT) is shown in Figure 6-6.(1)

0

Multi-target

bus Fails

(1)

See Test Procedures for Functional Tests.

5.8 Typical Characteristics

Te mperature (°C)

-10

0

10

20

30

40

50

60

70

80

1E-6

2E-6

3E-6

4E-6

5E-6

6E-6

7E-6

8E-6

VPUP = 3.3V

VPUP = 5V

Figure 5-1. Input Load Current (IL) vs Temperature (Standard

Speed)

Te mperature (°C)

-10

0

10

20

30

40

50

60

70

80

1E-6

2E-6

3E-6

4E-6

5E-6

6E-6

7E-6

8E-6

VPUP = 5V

Figure 5-2. Input Load Current (IL) vs Temperature (Overdrive

Speed)

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TMF0020

SLVSJQ4 – MAY 2026

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