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ISO7240CF bảng dữ liệu(PDF) 3 Page - Texas Instruments

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ISO7240CF bảng dữ liệu(HTML) 3 Page - Texas Instruments

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ELECTRICAL CHARACTERISTICS
SWITCHING CHARACTERISTICS
ISO7240CF
www.ti.com ................................................................................................................................................ SLLS869B – SEPTEMBER 2007 – REVISED APRIL 2008
VCC1 and VCC2 at 5-V operation, over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Quiescent
1
3
ICC1
Supply current
VI = VCC or 0 V, all channels, no load
mA
25 Mbps
7
10.5
Quiescent
15
22
ICC2
Supply current
VI = VCC or 0 V, all channels, no load
mA
25 Mbps
17
25
IOFF
Sleep mode output current
DISABLE at VCC, single channel
0
µA
IOH = –4 mA, See Figure 1
VCC – 0.4
VOH
High-level output voltage
V
IOH = –20 µA, See Figure 1
VCC – 0.1
IOL = 4 mA, See Figure 1
0.4
VOL
Low-level output voltage
V
IOL = 20 µA, See Figure 1
0.1
VI(HYS)
Input voltage hysteresis
200
mV
IIH
High-level input current
10
IN, DISABLE, CTRL from 0 V to VCC
µA
IIL
Low-level input current
–10
CI
Input capacitance to ground
IN at VCC, VI = 0.4 sin (4E6πt)
1
pF
CMTI
Common-mode transient immunity
VI = VCC or 0 V, See Figure 4
35
50
kV/
µs
VCC1 and VCC2 at 5-V operation, over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
tPLH, tPHL
Propagation delay, low-to-high-level output
18
42
See Figure 1
ns
PWD
Pulse-width distortion |tPHL – tPLH|
(1)
2.5
tsk(pp)
Part-to-part skew (2)
8
ns
tsk(o)
Channel-to-channel output skew (3)
0
2
ns
tr
Output signal rise time
2
See Figure 1
ns
tf
Output signal fall time
2
twake
Wake time from input disable
See Figure 2
15
µs
tfs
Failsafe output delay time from input power loss
See Figure 3
12
µs
(1)
Also referred to as pulse skew.
(2)
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
(3)
tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the
same direction while driving identical specified loads.
Copyright © 2007–2008, Texas Instruments Incorporated
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