SPC563M60L7 datasheet(98/128 Pages) STMICROELECTRONICS

98 / 128 page

Electrical characteristics

SPC563M64x, SPC563M60x

98/128

DocID14642 Rev 12

Fast

2.5/2.5

1.2/1.2

2.5/2.5

1.2/1.2

2.5/2.5

1.2/1.2

2.5/2.5

1.2/1.2

11(8)

pad_i_hv(12)

0.5/0.5

3/3

0.4/0.4

1.5/1.5

0.5

N/A

pull_hv

6000

5000/5000

N/A

These are worst case values that are estimated from simulation and not tested. The values in the table are simulated at

fSYS = 80 MHz, VDD = 1.14 V to 1.32 V, VDDE = 3 V to 3.6 V, VDDEH = 3 V to 3.6 V, TA = TL to TH.

This parameter is supplied for reference and is not guaranteed by design and not tested.

Delay and rise/fall are measured to 20% or 80% of the respective signal.

This parameter is guaranteed by characterization before qualification rather than 100% tested.

In high swing mode, high/low swing pad Vol and Voh values are the same as those of the slew controlled output pads.

Medium Slew-Rate Controlled Output buffer. Contains an input buffer and weak pullup/pulldown.

Output delay is shown in Figure 5. Add a maximum of one system clock to the output delay for delay with respect to system

clock.

Can be used on the tester.

This drive select value is not supported. If selected, it will be approximately equal to 11.

10. Slow Slew-Rate Controlled Output buffer. Contains an input buffer and weak pull-up/pull-down.

11. Slow Slew-Rate Controlled Output buffer. Contains an input buffer and weak pull-up/pull-down.

12. Stand alone input buffer. Also has weak pull-up/pull-down.

Table 35. Pad AC specifications (3.3 V)(1) (continued)

Pad Type

Output Delay

(ns)(2),(3)

Low-to-High/High-

to-Low

Rise/Fall Edge (ns)(3),(4)

Drive Load

(pF)

SRC/DSC

Min

Max

Min

Max

MSB,LSB

Table 36. Pad AC specifications (1.8 V)

Pad Type

Output Delay

(ns)(1),(2)

Low-to-High / High-

to-Low

Rise/Fall Edge (ns)(3)

Drive Load

(pF)

SRC/DSC

Min

Max

Min

Max

MSB,LSB

Fast

3.0/3.0

2.0/1.5

3.0/3.0

2.0/1.5

3.0/3.0

2.0/1.5

3.0/3.0

2.0/1.5

11(4)

This parameter is supplied for reference and is not guaranteed by design and not tested.

Delay and rise/fall are measured to 20% or 80% of the respective signal.

This parameter is guaranteed by characterization before qualification rather than 100% tested.

Can be used on the tester.

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