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SPC560D30L3 bảng dữ liệu(PDF) 48 Page - STMicroelectronics

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Electrical characteristics
SPC560D30x, SPC560D40x
48/82
DS6494 Rev 8
4.11.3
Start-up/Switch-off timings
4.12
Electromagnetic compatibility (EMC) characteristics
Susceptibility tests are performed on a sample basis during product characterization.
4.12.1
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user apply EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of
runaway conditions such as:
–
Corrupted program counter
–
Unexpected reset
–
Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program
counter corruption) can be reproduced by manually forcing a low state on the reset pin
or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device. When
unexpected behavior is detected, the software can be hardened to prevent
unrecoverable errors occurring (see the application note Software Techniques For
Improving Microcontroller EMC Performance (AN1015)).
Table 32. Start-up time/Switch-off time
Symbol
C
Parameter
Conditions(1)
Value
Unit
Min
Typ
Max
tFLARSTEXIT CC T Delay for flash module to exit reset mode
Code flash
—
—
125
µs
Data flash
—
—
150
µs
tFLALPEXIT
CC T
Delay for flash module to exit low-power
mode(2)
Code flash
—
—
0.5
µs
tFLAPDEXIT CC T
Delay for flash module to exit power-
down mode
Code flash
—
—
30
µs
Data flash
—
—
30(3)
µs
tFLALPENTRY CC T
Delay for flash module to enter low-
power mode
Code flash
—
—
0.5
µs
tFLAPDENTRY CC T
Delay for flash module to enter
power-down mode
Code flash
—
—
1.5
µs
Data flash
—
—
4(3)
µs
1. VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = 40 to 125 °C, unless otherwise specified.
2. Data flash does not support low-power mode.
3. If code flash is already switched-on.



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