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LF353M/NOPB bảng dữ liệu(PDF) 1 Page - Texas Instruments |
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LF353M/NOPB bảng dữ liệu(HTML) 1 Page - Texas Instruments |
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1 / 19 page ![]() LF353-N www.ti.com SNOSBH3F – APRIL 1998 – REVISED MARCH 2013 LF353-N Wide Bandwidth Dual JFET Input Operational Amplifier Check for Samples: LF353-N 1 FEATURES DESCRIPTION These devices are low cost, high speed, dual JFET 2 • Internally Trimmed Offset Voltage: 10 mV input operational amplifiers with an internally trimmed • Low Input Bias Current: 50pA input offset voltage (BI-FET II technology). They • Low Input Noise Voltage: 25 nV/ √Hz require low supply current yet maintain a large gain bandwidth product and fast slew rate. In addition, well • Low Input Noise Current: 0.01 pA/ √Hz matched high voltage JFET input devices provide • Wide Gain Bandwidth: 4 MHz very low input bias and offset currents. The LF353-N • High Slew Rate: 13 V/ μs is pin compatible with the standard LM1558 allowing designers to immediately upgrade the overall • Low Supply Current: 3.6 mA performance of existing LM1558 and LM358 designs. • High Input Impedance: 1012 Ω These amplifiers may be used in applications such as • Low Total Harmonic Distortion : ≤0.02% high speed integrators, fast D/A converters, sample • Low 1/f Noise Corner: 50 Hz and hold circuits and many other circuits requiring low • Fast Settling Time to 0.01%: 2 μs input offset voltage, low input bias current, high input impedance, high slew rate and wide bandwidth. The devices also exhibit low noise and offset voltage drift. Typical Connection 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2 All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Copyright © 1998–2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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