TLE7250LE

TLE7250SJ

General Product Characteristics

Data Sheet

16

Rev. 1.0, 2015-08-12

6

General Product Characteristics

6.1

Absolute Maximum Ratings

Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability. Integrated protection functions

are designed to prevent IC destruction under fault conditions described in the data sheet. Fault conditions

are considered as “outside” normal-operating range. Protection functions are not designed for continuos

repetitive operation.

Table 3

Absolute maximum ratings voltages, currents and temperatures1)

All voltages with respect to ground; positive current flowing into pin;

(unless otherwise specified)

1) Not subject to production test, specified by design

Parameter

Symbol

Values

Unit Note /

Test Condition

Number

Min.

Typ.

Max.

Voltages

Transmitter supply voltage

V

CC

-0.3

–

6.0

V

–

P_6.1.1

CANH DC voltage versus GND

V

CANH

-40

–

40

V

–

P_6.1.2

CANL DC voltage versus GND

V

CANL

-40

–

40

V

–

P_6.1.3

Differential voltage between

CANH and CANL

V

CAN SDiff

-40

–

40

V

–

P_6.1.4

Voltages at the input pins:

NEN, NRM, TxD

V

MAX_IN

-0.3

–

6.0

V

–

P_6.1.5

Voltages at the output pin:

RxD

V

MAX_OUT

-0.3

–

V

CC

V–

P_6.1.6

Currents

RxD output current

I

RxD

-20

–

20

mA

–

P_6.1.7

Temperatures

Junction temperature

T

j

-40

–

150

°C

–

P_6.1.8

Storage temperature

T

S

-55

–

150

°C

–

P_6.1.9

ESD Resistivity

ESD immunity at CANH, CANL

versus GND

V

ESD_HBM_

CAN

-9

–

9

kV

HBM

(100 pF via 1.5 kΩ)2)

2) ESD susceptibility, Human Body Model “HBM” according to ANSI/ESDA/JEDEC JS-001

P_6.1.10

ESD immunity at all other pins

V

ESD_HBM_

ALL

-2

–

2

kV

HBM

(100 pF via 1.5 kΩ)2)

P_6.1.11

ESD immunity to GND

V

ESD_CDM

-750

–

750

V

CDM3)

3) ESD susceptibility, Charge Device Model “CDM” according to EIA/JESD22-C101 or ESDA STM5.3.1

P_6.1.12