DIX9211 datasheet(2/110 Pages) TI2

2 / 110 page

DIX9211

SBAS519 – SEPTEMBER 2010

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE/ORDERING INFORMATION(1)

OPERATING

PACKAGE

TEMPERATURE

PACKAGE

ORDERING

TRANSPORT MEDIA,

PRODUCT

PACKAGE-LEAD

DESIGNATOR

RANGE

MARKING

NUMBER

QUANTITY

DIX9211PT

Tray, 250

DIX9211

LQFP-48

–40°C to +85°C

DIX9211

DIX9211PTR

Tape and Reel, 1000

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the

device product folder on www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range (unless otherwise noted).

DIX9211

UNIT

Supply voltage

VCC, VDD, VDDRX

–0.3 to +4.0

Supply voltage differences: VCC, VDD

±0.1

Ground voltage differences: AGND, DGND, GNDRX

±0.1

RXIN2, RXIN3, RXIN4/ASCKI0, RXIN5/ABCKI0, RXIN6/ALRCKI0,

–0.3 to +6.5

RXIN7/ADIN0, MC/SCL, MDI/SDA, MDO/ADR, MS/ADR1, RST

MPIO_A0-A3, MPIO_B0-B3, MPIO_C0-C3

–0.3 to +6.5

Digital input voltage

RXIN0, RXIN1 (For S/PDIF TTL / OPTICAL input)

–0.3 to +6.5

MODE

–0.3 to +4.0

RXIN0, RXIN1 (For S/PDIF Coaxial Input Only)

–0.3 to (VDDRX + 0.3) < +4.0

Analog input voltage

XTI, XTO

–0.3 to (VDD + 0.3) < +4.0

FILT

–0.3 to (VCC + 0.3) < +4.0

Input current (any pins except supplies)

±10

Ambient temperature under bias

–40 to +125

°C

Storage temperature

–55 to +150

°C

Junction temperature

+150

°C

Package temperature (reflow, peak)

+260

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

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