DAC8581

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SLAS481C – AUGUST 2005 – REVISED OCTOBER 2012

ELECTRICAL CHARACTERISTICS

All specifications at TA = TMIN to TMAX, +AVDD = +5 V, –AVDD = –5 V, DVDD = +5 V (unless otherwise noted).

DAC8581

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

STATIC PERFORMANCE

Resolution

16

Bits

Linearity error

VREF = 4.096 V

±0.03

±0.1

%FS

Differential linearity error

±0.25

±0.5

LSB

Gain error

1

2

3

%FS

Gain drift

±5

ppm/°C

Bipolar zero error

–5

±25

mV

Bipolar zero drift

±20

μV/°C

Total drift

±10

ppm/°C

OUTPUT CHARACTERISTICS

VREF up to 5.5 V, when AVDD = 6 V, AVSS = –6

Voltage output

–VREF

VREF

V

V

Output impedance

1

Ω

Maximum output current

±25

mA

CL < 200 pF, RL = 2 kΩ, to 0.1% FS, 8-V step

0.65

Settling time

μs

To 0.003% FS

1

Slew rate(1)

35

V/

μs

Code change glitch

1 LSB change around major carry

0.5

nV-S

Overshoot

Full-scale change

50

mV

Digital feedthrough(2)

0.5

nV-S

Digital sine wave input, fOUT = 1 kHz,

SNR

108

dB

BW = 10 kHz, 2-MSPS update rate

Digital sine wave input, fOUT = 20 kHz,

THD

–72

dB

8-VPP output, 2-MSPS update rate

0.1 Hz to 10 Hz

25

μVPP

Output voltage noise

At 10-kHz offset frequency

25

nV/

√Hz

At 100-kHz offset frequency

20

nV/

√Hz

Power supply rejection

VDD varies ±10%

0.75

mV/V

REFERENCE

Large signal: 2-VPP sine wave on 4 V DC

3

MHz

Reference input bandwidth

Small signal: 100-mVPP sine wave on 4 V DC

10

MHz

Reference input voltage range

3

AVDD

V

Reference input impedance

5

k

Ω

Reference input capacitance

5

pF

DIGITAL INPUTS

VIH

0.7 x DVDD

V

VIL

GND

0.3 x DVDD

Input current

±1

μA

Input capacitance

10

pF

Power-on delay

From VDD high to CS low

20

μs

(1)

Slew rate is measured from 10% to 90% of transition when the output changes from 0 to full-scale.

(2)

Digital feedthrough is defined as the impulse injected into the analog output from the digital input. It is measured when the DAC output

does not change, CS is held high, and while SCLK and SDIN signals are toggled.

Copyright © 2005–2012, Texas Instruments Incorporated

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