Freq

[MHz]

0

3

6

9

12

15

18

21

24

27

30

33

10

12

14

16

18

20

22

24

26

28

30

32

34

D001

x4 Mode

x1 Mode

Frequency (MHz)

0

10

20

30

40

50

60

70

80

90

100 110

450

475

500

525

550

575

600

625

650

675

700

725

750

775

tc_D

-40°C, 3.0 V

-40°C, 3.3 V

-40°C, 3.6 V

25°C, 3.0 V

25°C, 3.3 V

25°C, 3.6 V

85°C, 3.0 V

85°C, 3.3 V

85°C, 3.6 V

Frequency (MHz)

0

10

20

30

40

50

60

70

80

90

100 110

500

550

600

650

700

750

800

850

900

tc_D

-40°C, 3.0 V

-40°C, 3.3 V

-40°C, 3.6 V

25°C, 3.0 V

25°C, 3.3 V

25°C, 3.6 V

85°C, 3.0 V

85°C, 3.3 V

85°C, 3.6 V

5

CDCS504-Q1

www.ti.com

SCAS951 – APRIL 2017

Product Folder Links: CDCS504-Q1

Submit Documentation Feedback

Copyright © 2017, Texas Instruments Incorporated

Electrical Characteristics – Device Characteristics (continued)

over recommended operating free-air temperature range (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

(1)

Measured with Test Load, see Figure 4.

(2)

Not production tested.

VOL

LVCMOS low-level output voltage

IOL = 0.1 mA

0.1

V

IOL = 8 mA

0.5

IOL = 12 mA

0.8

IOZ

High-impedance-state output current

OE = Low

–2

2

μA

tJIT(C-C)

Cycle to cycle jitter(1)

fout = 11.264 MHz; FS = 1,

10000 Cycles

144

ps

tr

Rise time(1)

20%–80%

0.65

ns

tf

Fall time(1)

20%–80%

0.55

ns

Odc

Output duty cycle(2)

45%

55%

6.6 Typical Characteristics

Figure 1. Typical Tr vs Output Frequency, VDD,

Temperature in X4 Mode

Figure 2. Typical Tf vs Output Frequency, VDD, Temperature

in X4 Mode

VCC = 3.3 V, output loaded with test load

Figure 3. IDD vs Input Frequency