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S32K311NHT0MPAST bảng dữ liệu(PDF) 76 Page - NXP Semiconductors |
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S32K311NHT0MPAST bảng dữ liệu(HTML) 76 Page - NXP Semiconductors |
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76 / 152 page ![]() Table 26. 5.0V (4.5V - 5.5V) GPIO Output AC Specification (continued) Symbol Description Min Typ Max Unit Condition Spec Number TR_TF_50_M 5.0V Medium GPIO rise/fall time 1,2,3,4 4.3 — 13.8 ns DSE=0, SRE=1 CL (max) = 50pF — TR_TF_50_M 5.0V Medium GPIO rise/fall time 1,2,3,4 1.6 — 7.1 ns DSE=1, SRE=0 CL (max) = 50pF — TR_TF_50_M 5.0V Medium GPIO rise/fall time 1,2,3,4 2.7 — 9.6 ns DSE=1, SRE=1 CL (max) = 50pF — TR_TF_50_F 5.0V Fast GPIO rise/ fall time 1,2,3 0.4 — 3.15 ns DSE=0, SRE=0 CL (max) = 25pF — TR_TF_50_F 5.0V Fast GPIO rise/ fall time 1,2,3 1.5 — 6.7 ns DSE=0, SRE=1 CL (max) = 25pF — TR_TF_50_F 5.0V Fast GPIO rise/ fall time 1,2,3 0.3 — 2.02 ns DSE=1, SRE=0 CL (max) = 25pF — TR_TF_50_F 5.0V Fast GPIO rise/ fall time 1,2,3 0.9 — 4.85 ns DSE=1, SRE=1 CL (max) = 25pF — TR_TF_50_F 5.0V Fast GPIO rise/ fall time 1,2,3,4 1.0 — 5.8 ns DSE=0, SRE=0 CL (max) = 50pF — TR_TF_50_F 5.0V Fast GPIO rise/ fall time 1,2,3,4 1.9 — 8.5 ns DSE=0, SRE=1 CL (max) = 50pF — TR_TF_50_F 5.0V Fast GPIO rise/ fall time 1,2,3,4 0.9 — 3.0 ns DSE=1, SRE=0 CL (max) = 50pF — TR_TF_50_F 5.0V Fast GPIO rise/ fall time 1,2,3,4 1.3 — 6.1 ns DSE=1, SRE=1 CL (max) = 50pF — 1. I/O timing specifications are valid for the un-terminated 50ohm transmission line reference load given in the figure below. A lumped 8pF load (typical) is assumed at the end of a 5 inch microstrip trace on standard FR4 with approximately 3.3pF/ inch. For best signal integrity, the series resistance in the transmission line should be matched closely to the selected output resistance (ROUT_*) of the I/O pad. 2. GPIO output transition time information can be obtained from the device IBIS model. IBIS models are recommended for system level simulations, as discrete values for I/O transition times are not representative of the I/O pad behavior when connected to an actual transmission line load. 3. GPIO rise/fall time specifications are derived from simulation model for the defined operating points (between 20% and 80% of VDD_HV_A/B level). Actual application rise/fall time should be extracted from IBIS model simulations with the microcontroller models and application PCB. 4. Output timing valid for maximum external load C L = 50pF (includes PCB trace, package trace, and external device input load). NXP Semiconductors I/O parameters S32K3xx Data Sheet, Rev. 10, 07/2024 Data Sheet: Technical Data Preliminary Information for S32K389 76 / 152 |
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