I•CODE1 Chip Specification

Rev. 2.1

May 2000

SL040521.doc/M

Public

Page 17 of 22

15 Inlet/Label Characterisation and Test

15.1 Characterisation of the Inlet/Label

The parameters recommended to be characterised for the inlet/label are:

Parameter

Symbol

Conditions

Resonant frequency

No command transmitted to the inlet/label

à

Label generates no response

à No modulation

Threshold value for

UNSELECTED READ command

(standard mode)

UNSELECTED READ command OK

Threshold value for WRITE command

(standard mode)

WRITE (and Verifying READ) command OK

15.2 Final Test of the Inlet/Label

Basic flow for production and test:

1. Production of wafer

2. Testing of dies on wafer

3. Writing of serial numbers and pre-configuration

4. Sawing of wafer

5. Assembly of inlets/labels

6. Final test of inlets/labels

7. Writing of customer data

To detect damage of EEPROM cells during production of inlets/labels a final test of the

EEPROM after assembly of the inlet/label is recommended. This is necessary to achieve

lowest failure rates.