PAC7112 datasheet(35/56 Pages) FREESCALE

tên linh kiện	PAC7112

Giải thích chi tiết về linh kiện	Microcontroller Family Hardware Specifications

PDF	56 Pages

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ElectricalCharacteristics

MAC7100 Microcontroller Family Hardware Specifications, Rev. 1.2

Preliminary

Freescale Semiconductor

3.13.8 NVM Reliability

The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process

monitors and burn-in to screen early life failures. The failure rates for data retention and program/erase

cycling are specified at the operating conditions noted. The program/erase cycle count on the sector is

incremented every time a sector or mass erase event is executed.

NOTE

All values shown in Table 36 are target values and subject to

characterization. For Flash cycling performance, each program operation

must be preceded by an erase.

Table 36. NVM Reliability Characteristics

Conditions shown in Table 7 unless otherwise noted.

Num

Rating

Min

Unit

X11

C Program/Data Flash Program/Erase endurance (–40C to +125C)

10,000

Cycles

X12

C Program/Data Flash Data Retention Lifetime

Years

PAC7112 bảng dữ liệu(PDF) 35 Page - Freescale Semiconductor, Inc