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HT2MOA3S20/E/3 bảng dữ liệu(PDF) 19 Page - NXP Semiconductors |
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HT2MOA3S20/E/3 bảng dữ liệu(HTML) 19 Page - NXP Semiconductors |
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19 / 22 page ![]() Specifications of the HT2 MOA3 S20 Rev. 1.1 1997-08-19 Ht2moa3.doc/HS Page 19 of 22 7 Characterisation and Test of the Final Transponder 7.1 Characterisation of the Transponder The parameters recommended to be characterised for the transponder are: Parameter Comment Resonant frequency fres Transponder does not modulate Resonant frequency @ Tamb = 22°C, @ BTH Threshold value BTH Start of modulation Threshold value for READ BRD Command READ_PAGE OK Threshold value for WRITE BWR Command WRITE_PAGE OK For the measurement of these parameters we recommend to use the test equipment available from SCEMTEC, Marienheide-Rodt, Germany (Transponder Measurement System STM-1). This device also supports functional testing (besides parameter testing). Therefore it can also be used as production test equipment for the final transponder test. For further information please contact Scemtec GmbH. 7.2 Final Test of the Transponder In addition to the equipment described in the previous chapter Philips Semiconductors offers a device for a final functional test of transponders, the HITAG TM Test System HT OT490. Parameter tests are not supportet by this device. Basic flow for production and test: 1. Assembly of transponders 2. Functional test and final test of the EEPROM Since the Keys and Logdata are changed during final test the Configuration and personalization must take place after the final test. The final test is disabled (not reversible) by setting the Tag-test mode bit to 0. For the final test of transponders we recommend to use the HITAG TM Test System HT OT490 of Philips Semiconductors or the Transponder Measurement System STM-1 of Scemtec. |
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