FN8915 Rev.1.00

Page 21 of 32

March 26, 2018

ISL71026M

6. Radiation Tolerance

6.

Radiation Tolerance

The ISL71026M is a radiation tolerant device for commercial space applications, Low Earth Orbit (LEO)

applications, high altitude avionics, launch vehicles, and other harsh environments. This device’s response to Total

Ionizing Dose (TID) radiation effects and Single-Event Effects (SEE) has been measured, characterized, and

reported in the following sections. However, TID performance is not guaranteed through radiation acceptance

testing, nor is the SEE characterized performance guaranteed.

6.1

Total Ionizing Dose (TID) Testing

6.1.1

Introduction

This test was conducted to determine the sensitivity of the part to the total dose environment. Down points were

0krad(Si), 10krad(Si), 20krad(Si), and 30krad(Si). The irradiations were followed by a biased anneal for 168

hours at +100°C.

Total dose testing was performed using a Hopewell Designs N40 panoramic 60Co irradiator. The irradiations

were performed at 0.00875rad(Si)/s. A PbAl box was used to shield the test fixture and devices under test

against low energy secondary gamma radiation.

The characterization matrix consisted of 30 samples irradiated under bias and 30 samples irradiated with all

pins grounded. Six control units were used to ensure repeatable data. Three different wafers were used. The bias

configuration is shown in Figure 50.

All electrical testing was performed outside the irradiator using the production Automated Test Equipment

(ATE), with data logging at each down point (including anneal). Downpoint electrical testing was performed at

room temperature.

Figure 50. Irradiation Bias Configuration and Power Supply Sequencing for the ISL71026M

Power On - One Supply Voltage

D

GND

VCC

R

RS

CANH

CANL

LBK

DUT

VCC = 3.6V, +0.25V -0.0V

8

7

6

5

1

2

3

4

R2

R3

TP1

TP2

TP3

TP4

GND

VCC

(14)

(13)

(12)

(11)