FN3304 Rev 0.00

Page 1 of 11

December 1992

FN3304

Rev 0.00

December 1992

CD4029BMS

CMOS Presettable Up/Down Counter

DATASHEET

Description

CD4029BMS consists of a four-stage binary or BCD-decade up/

down counter with provisions for look-ahead carry in both count-

ing modes. The inputs consist of a single CLOCK, CARRY-IN

(CLOCK ENABLE), BINARY/DECADE, UP/DOWN, PRESET

ENABLE, and four individual JAM signals. Q1, Q2, Q3, Q4 and a

CARRY OUT signal are provided as outputs.

A high PRESET ENABLE signal allows information on the JAM

INPUTS to preset the counter to any state asynchronously with

the clock. A low on each JAM line, when the PRESET-ENABLE

signal is high, resets the counter to its zero count. The counter is

advanced one count at the positive transition of the clock when

the CARRY-IN and PRE-SET ENABLE signals are low.

Advancement is inhibited when the CARRY-IN or PRESET

ENABLE signals are high. The CARRY-OUT signal is normally

high and goes low when the counter reaches its maximum count

in the UP mode or the minimum count in the DOWN mode pro-

vided the CARRY-IN signal is low. The CARRY-IN signal in the

low state can thus be considered a CLOCK ENABLE. The

CARRY-IN terminal must be connected to VSS when not in use.

Binary counting is accomplished when the BINARY/DECADE

input is high; the counter counts in the decade mode when the

BINARY/DECADE input is low. The counter counts up when the

UP/DOWN input is high, and down when the UP/DOWN input is

low. Multiple packages can be connected in either a parallel-

clocking or a ripple-clocking arrangement as shown in Figure 17.

Parallel clocking provides synchronous control and hence faster

response from all counting outputs. Ripple-clocking allows for

longer clock input rise and fall times.

The CD4029BMS is supplied in these 16-lead outline packages:

Braze Seal DIP

H4X

Frit Seal DIP

H1F

Ceramic Flatpack H6W

Features

• High-Voltage Type (20V Rating)

• Medium Speed Operation: 8MHz (Typ.) at CL = 50pF

and VDD - VSS = 10V

• Multi-Package Parallel Clocking for Synchronous High

Speed Output Response or Ripple Clocking for Slow

Clock Input Rise and Fall Times

• “Preset Enable” and Individual “Jam” Inputs Provided

• Binary or Decade Up/Down Counting

• BCD Outputs in Decade Mode

• 100% Tested for Maximum Quiescent Current at 20V

• 5V, 10V and 15V Parametric Ratings

• Standardized Symmetrical Output Characteristics

• Maximum Input Current of 1

A at 18V Over Full Pack-

age-Temperature Range; 100nA at 18V and +25oC

• Noise Margin (Over Full Package Temperature Range):

- 1V at VDD = 5V

- 2V at VDD = 10V

- 2.5V at VDD = 15V

• Meets All Requirements of JEDEC Tentative Standards

No. 13B, “Standard Specifications for Description of

“B” Series CMOS Device’s

Applications

• Programmable Binary and Decade Counting/Fre-

quency Synthesizers-BCD Output

• Analog to Digital and Digital to Analog Conversion

• Up/Down Binary Counting

• Difference Counting

• Magnitude and Sign Generation

• Up/Down Decade Counting

Pinout

CD4029BMS

TOP VIEW

14

15

16

9

13

12

11

10

1

2

3

4

5

7

6

8

PRESET ENABLE

Q4

JAM 4

JAM 1

CARRY IN

Q1

VSS

CARRY OUT

VDD

Q3

JAM 3

JAM 2

Q2

UP/DOWN

BINARY/DECADE

CLOCK

Functional Diagram

13

12

16

PRESET

ENABLE

14

3

1234

JAM INPUTS

VDD

CARRY IN

(CLOCK

ENABLE)

5

9

10

15

BINARY/

DECADE

UP/DOWN

CLOCK

8

VSS

7

2

14

11

6 Q1

Q2

Q3

Q4

CARRY

OUT

BUFFERED

OUTPUTS