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công cụ tìm kiếm bảng dữ liệu linh kiện điện tử |
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74F182 bảng dữ liệu(PDF) 5 Page - NXP Semiconductors |
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74F182 bảng dữ liệu(HTML) 5 Page - NXP Semiconductors |
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5 / 6 page  Philips Semiconductors Product specification 74F182 Look-ahead carry generator 1991 Apr 15 6 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VOH High-level output voltage VCC = MIN, VIL = MAX, VIH = MIN IOH = MAX ±10%V CC 2.5 V VOH High-level output voltage VCC = MIN, VIL = MAX, VIH = MIN IOH = MAX ±5%V CC 2.7 3.4 V VOL Low-level output voltage VCC = MIN, VIL = MAX, VIH = MIN IOL = MAX ±10%V CC 0.30 0.50 V VOL Low-level output voltage VCC = MIN, VIL = MAX, VIH = MIN IOL = MAX ±5%V CC 0.30 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 250 µA IIH High-level input current VCC = MAX, VI = 2.7V 250 µA IIL Low-level input current Cn VCC = MAX, VI = 0.5V –1.2 mA IIL Low-level input current G0, G2 VCC = MAX, VI = 0.5V –8.4 mA IIL Low-level input current G1 VCC = MAX, VI = 0.5V –9.6 mA IIL Low-level input current G3, P0, P1 VCC = MAX, VI = 0.5V –4.8 mA P2 –3.6 mA P3 –2.4 mA IOS Short-circuit output current3 VCC = MAX –60 –150 mA ICC Supply current (total) ICCH VCC = MAX 18 28 mA ICC Supply current (total) ICCL VCC = MAX 24 36 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS SYMBOL PARAMETER TEST CONDITION LIMITS UNIT SYMBOL PARAMETER TEST CONDITION VCC = +5.0V Tamb = +25°C CL = 50pF RL = 500Ω VCC = +5.0V ± 10% Tamb = 0°C to +70°C CL = 50pF RL = 500Ω UNIT MIN TYP MAX MIN MAX tPLH tPHL Propagation delay Cn to Cn+x, Cn+y, Cn+z Waveform 2 2.5 2.5 5.0 5.0 8.0 7.5 2.5 2.5 8.5 8.5 ns tPLH tPHL Propagation delay P0, P1, or P2 to Cn+x, Cn+y, Cn+z Waveform 1 2.0 1.5 5.0 3.5 7.0 5.0 1.5 1.5 8.0 6.0 ns tPLH tPHL Propagation delay G0, G1, or G2 to Cn+x, Cn+y, Cn+z Waveform 1 1.5 1.5 4.0 3.0 7.5 5.0 1.5 1.5 8.5 5.5 ns tPLH tPHL Propagation delay P1, P2, or P3 to G Waveform 2 2.0 3.0 7.0 5.0 10.0 7.0 1.5 2.5 11.0 8.0 ns tPLH tPHL Propagation delay Gn to G Waveform 2 1.5 3.0 5.0 5.0 7.0 7.0 1.5 2.5 7.5 8.0 ns tPLH tPHL Propagation delay Pn to P Waveform 2 1.5 2.5 3.5 4.0 6.0 6.0 1.5 2.5 7.5 6.5 ns |
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