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U637256
2
March 31, 2006
STK Control #ML0054
Rev 1.0
EEPROM Array
512 x (64 x 8)
STORE
RECALL
SRAM
Array
512 Rows x
64 x 8 Columns
A5
A6
A7
A8
A9
A11
A12
A13
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
Column I/O
Column Decoder
VCC
VSS
VCC
G
E
W
A0 A1 A2 A3 A4 A10
Software
Detect
A0 - A13
A14
Store/
Recall
Control
Power
Control
Operating Mode
E
W
G
DQ0 - DQ7
Standby/not selected
H
**
High-Z
Internal Read
L
H
H
High-Z
Read
L
H
L
Data Outputs Low-Z
Write
L
L
*
Data Inputs High-Z
Truth Table forSRAM Operations
Block Diagram
Absolute Maximum Ratingsa
Symbol
Min.
Max.
Unit
Power Supply Voltage
VCC
-0.5
7
V
Input Voltage
VI
-0.3
VCC+0.5
V
Output Voltage
VO
-0.3
VCC+0.5
V
Power Dissipation
PD
1W
Operating Temperature
C-Type
K-Type
Ta
0
-40
70
85
°C
°C
Storage Temperature
Tstg
-65
150
°C
Characteristics
All voltages are referenced to VSS = 0 V (ground).
All characteristics are valid in the power supply voltage range and in the operating temperature range specified.
Dynamic measurements are based on a rise and fall time of
≤ 5 ns, measured between 10 % and 90 % of V
I, as well as
input levels of VIL = 0 V and VIH = 3 V. The timing reference level of all input and output signals is 1.5 V,
with the exception of the tdis-times and ten-times, in which cases transition is measured ± 200 mV from steady-state voltage.
* H or L
a:
Stresses greater than those listed under „Absolute Maximum Ratings“ may cause permanent damage to the device. This is a stress
rating only, and functional operation of the device at condition above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
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