STM32F107RB datasheet(57/108 Pages) STMICROELECTRONICS

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STM32F105xx, STM32F107xx

Electrical characteristics

107

operation. However, in order to give an indication of the robustness of the microcontroller in

cases when abnormal injection accidentally happens, susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into

the I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out of range parameter: ADC error above a certain limit (>5

LSB TUE), out of spec current injection on adjacent pins or other functional failure (for

example reset, oscillator frequency deviation).

The test results are given in Table 35

5.3.13

I/O port characteristics

General input/output characteristics

Unless otherwise specified, the parameters given in Table 36 are derived from tests

performed under the conditions summarized in Table 9. All I/Os are CMOS and TTL

compliant.

Table 35. I/O current injection susceptibility

Symbol

Description

Functional susceptibility

Unit

Negative

injection

Positive

injection

IINJ

Injected current on OSC_IN32,

OSC_OUT32, PA4, PA5, PC13

-0

Injected current on all FT pins

-5

Injected current on any other pin

-5

Table 36. I/O static characteristics

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VIL

Standard IO input low

level voltage

–0.3

0.28*(VDD-2 V)+0.8 V

IO FT(1) input low level

voltage

–0.3

0.32*(VDD-2V)+0.75 V

VIH

Standard IO input high

level voltage

0.41*(VDD-2 V)+1.3 V

VDD+0.3

IO FT(1) input high level

voltage

VDD > 2 V

0.42*(VDD-2 V)+1 V

5.5

VDD ≤ 2 V

5.2

Vhys

Standard IO Schmitt

trigger voltage

hysteresis(2)

200

IO FT Schmitt trigger

voltage hysteresis(2)

5% VDD(3)

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