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STM32H750VB bảng dữ liệu(PDF) 265 Page - STMicroelectronics |
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STM32H750VB bảng dữ liệu(HTML) 265 Page - STMicroelectronics |
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265 / 335 page ![]() DS12556 Rev 5 265/334 STM32H750VB STM32H750ZB STM32H750IB STM32H750XB Electrical characteristics (rev V) 311 7.3.18 Quad-SPI interface characteristics Unless otherwise specified, the parameters given in Table 179 and Table 180 for QUADSPI are derived from tests performed under the ambient temperature, fAHB frequency and VDD supply voltage conditions summarized in Table 120: General operating conditions, with the following configuration: Output speed is set to OSPEEDRy[1:0] = 11 Measurement points are done at CMOS levels: 0.5VDD IO Compensation cell activated. HSLV activated when VDD ≤ 2.7 V VOS level set to VOS1 Refer to Section 7.3.15: I/O port characteristics for more details on the input/output alternate function characteristics. The following table summarizes the parameters measured in SDR mode. Table 178. LPSDR SDRAM Write timings(1) 1. Guaranteed by characterization results. Symbol Parameter Min Max Unit tw(SDCLK) FMC_SDCLK period 2Tfmc_ker_ck – 1 2Tfmc_ker_ck+0.5 ns td(SDCLKL _Data) Data output valid time - 2.5 th(SDCLKL _Data) Data output hold time 0 - td(SDCLKL_Add) Address valid time - 2.5 td(SDCLKL-SDNWE) SDNWE valid time - 2.5 th(SDCLKL-SDNWE) SDNWE hold time 0 - td(SDCLKL- SDNE) Chip select valid time - 3 th(SDCLKL- SDNE) Chip select hold time 0 - td(SDCLKL-SDNRAS) SDNRAS valid time - 1.5 th(SDCLKL-SDNRAS) SDNRAS hold time 0 - td(SDCLKL-SDNCAS) SDNCAS valid time - 1.5 td(SDCLKL-SDNCAS) SDNCAS hold time 0 - Table 179. QUADSPI characteristics in SDR mode(1) Symbol Parameter Conditions Min Typ Max Unit Fck11/TCK QUADSPI clock frequency 2.7<VDD<3.6 V CL = 20 pF -- 133 MHz 1.62<VDD<3.6 V CL = 15 pF -- 100 |
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