SE050A2HQ1SLASHZ01SHZ datasheet(16/30 Pages) NXP

16 / 30 page

NXP Semiconductors

SE050

Plug & Trust Secure Element

SE050

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Product data sheet

Rev. 3.0 — 12 May 2020

504930

16 / 30

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

Input current in "weak pull-up"

input mode

0 V ≤ VI ≤ VCC; Test

conditions for the

maximum absolute

value: II(max):VI = 0 V,

VCC = VCC(max)

-50

μA

IILIH

Leakage input current at input

voltage beyond VCC in "weak

pull-up" input mode

VCC < VI ≤ VCC + 0.3 V;

-40 °C ≤

Tamb ≤ +105 °C;

Test conditions: VI = VCC

+ 0.3

VCC = VCC(max)Tamb =

+105 °C

μA

-0.3 V ≤ VI < 0 V; -40 °C

≤ Tamb ≤

+30 °C

Test conditions: VI = -0.3

VCC= VCC(max)Tamb =

+30 °C

-50

μA

IILIL

Leakage input current at input

voltage below VSS in "weak

pull-up" input mode

-0.3 V ≤ VI < 0 V;+30 °C

≤ Tamb ≤

+105 °C

Test conditions: VI = -0.3

VCC= VCC(max)Tamb =

+105 °C

-1000

μA

IILIHQ

Leakage input current at

input voltage beyond VCC

(only in "quasi-bidirectional"

mode)

VCC < VI ≤ VCC + 0.3 V;

-40 °C ≤

Tamb≤ +105 °C

Test conditions: VI = VCC

0.3 V;VCC = VCC(max);

Tamb = +105 °C

100

μA

-0.3 V ≤ VI < 0 V; -40 °C

≤ Tamb ≤

+30 °C

Test conditions: VI = -0.3

VCC = VCC(max)Tamb=

+30 °C

-120

μA

IILILQ

Leakage input current at input

voltage below VSS (only in

"quasi-bidirectional"

mode)

-0.3 V ≤ VI < 0 V;+30 °C

≤ Tamb ≤

+105 °C

Test conditions: VI = -0.3

VCC = VCC(max)Tamb=

+105 °C

-1000

μA

VOH

HIGH level output voltage

IOH = -20 μA;

[2]

0.7 VCC

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