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LM393LV-Q1

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SNOSDB3 – JUNE 2020

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Copyright © 2020, Texas Instruments Incorporated

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

Input terminals are diode-clamped to (V–). Input signals that can swing more than 0.3 V beyond the supply rails must be current-limited

to 10 mA or less. Additionally, Inputs (IN+, IN–) can be greater than (V+) and OUT as long as it is within the –0.3 V to 6 V range

(3)

Output (OUT) for open drain can be greater than (V+) and inputs (IN+, IN–) as long as it is within the –0.3 V to 6 V range

(4)

Maximum current for GND pins due to combined output load current for all channels sinking. Continuous short circuit to V+ will result in

excessive heating and exceeding the maximum allowed junction temperature of 150°C, resulting in eventual rapid device failure.

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

–0.3

6

V

–0.3

6

V

Current into Input pins (IN+, IN–)

–10

10

mA

–0.3

6

V

200

mA

150

°C

–65

150

°C

(1)

AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.

6.2 ESD Ratings

VALUE

UNIT

Electrostatic

discharge

±2000

V

Charged-device model (CDM), per AEC Q100-0111

±1000

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

MIN

MAX

UNIT

1.65

5.5

V

Input voltage range (IN+, IN–) from (V–)

–0.3

5.5

V

–40

125

°C