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TUSB2E22 bảng dữ liệu(PDF) 10 Page - Texas Instruments

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tên linh kiện TUSB2E22
Giải thích chi tiết về linh kiện  TUSB2E22 eUSB2-USB 2.0 Dual Repeater
PDF  26 Pages
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TUSB2E22 bảng dữ liệu(HTML) 10 Page - Texas Instruments

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background image
Repeater
86100
Scope
or
BERT
50Ÿ
eUSB2
Test Channel
22.1
22.1
15.8
15.8
Test Channel
81130A
Pattern Generator
or
BERT
50Ÿ
USB 2.0
Vin * 0.693
Vin scaled for impedance conversion
40
Ÿ
45
Ÿ
Impedance
conversion
Impedance
conversion
USB 2.0 High speed test packets
USB 2.0 TX Vpp * 0.68
Vout scaled for impedance conversion
Repeater
81130A
Pattern Generator
or
BERT
50Ÿ
USB 2.0 High speed test packets
eUSB2 TX Vpp * 0.56
Vout scaled for impedance conversion
eUSB2
Test Channel
22.1
22.1
15.8
15.8
Test Channel
86100
Scope
or
BERT
50Ÿ
USB 2.0
Vin * 0.76
Vin scaled for impedance conversion
40
Ÿ
45
Ÿ
Impedance
conversion
Impedance
conversion
10
TUSB2E22
SNLS648A – FEBRUARY 2019 – REVISED DECEMBER 2019
www.ti.com
Submit Documentation Feedback
Copyright © 2019, Texas Instruments Incorporated
7.7 Timing Requirements
MIN
NOM
MAX
UNIT
RESET TIMING
t_VDD1V8_R
AMP
Ramp time for VDD1V8 to reach minimum 1.62V
2
ms
t_VDD3V3_R
AMP
Ramp time for VDD3V3 to reach minimum 3.0V
2
ms
t_su_CROSS
Setup time for CROSS sampled at the de-assertion of RESETB
0
ms
t_hd_CROSS Hold time for CROSS sampled at the de-assertion of RESETB
3
ms
t_aRESETB
duration for RESETB to be asserted low to complete reset while powered
10
us
t_RH_READY
Time for eUSB2 interface to be ready after RESETB is de-asserted or
(VDD1V8 and VDD3V3) reach minimum recommended voltages, whichever
is later
3
ms
8 Parametric Measurement Information
Figure 1. USB 2.0 TX Output (Egress) Jitter, Eye Mask Test Setup
Figure 2. eUSB2 TX Output (Ingress) Jitter, Eye Mask Test Setup



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