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Giải thích chi tiết về linh kiện  SPI(x1/x2/x4) NAND Flash
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nhà sản xuất  GIGADEVICE [GigaDevice Semiconductor (Beijing) Inc.]
Trang chủ  http://www.gigadevice.com/
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SPI(x1/x2/x4) NAND Flash
1G
34
Table14-4. Driver Register Bits Descriptions
DS_S1
DS_S0
Driver Strength
0
0
50%
0
1
25%
1
0
75%
1
1
100%
14.4 Assistant Bad Block Management
As a NAND Flash, the device may have blocks that are invalid when shipped from the factory, and a minimum number of
valid blocks (NVB) of the total available blocks are specified. An invalid block is one that contains at least one page that has
more bad bits than can be corrected by the minimum required ECC. Additional bad blocks may develop with use. However,
the total number of available blocks will not fall below NVB during the endurance life of the product.
Although NAND Flash memory devices may contain bad blocks, they can be used reliably in systems that provide bad-
block management and error-correction algorithms, which ensure data integrity. Internal circuitry isolates each block from
other blocks, so the presence of a bad block does not affect the operation of the rest of the NAND Flash array.
NAND Flash devices are shipped from the factory erased. The factory identifies invalid blocks before shipping by
programming the Bad Block Mark (00h) to the first spare area location in each bad block. This method is compliant with
ONFI Factory Defect Mapping requirements. See the following table I bad-block mark.
System software should initially check the first spare area location for non-FFH data I first page of each block prior to
performing any program or erase operations on the NAND Flash device. A bad-block table can then be created, enabling
system software to map around these areas. Factory testing is performed under worst-case conditions. Because invalid
blocks may be marginal, it may not be possible to recover the bad-block marking if the block is erased.
To simplify the system requirement and guard the data integration, GigaDevice SPI NAND provides assistant Management
options as below.
Table14-5. Bad Block Mark information
Description
Density
Requirement
Minimum number of valid blocks (NVB)
1G
1004
Total available blocks per die
1G
1024
First spare area location
Byte 2048
Bad-block mark
00h(use non FFH to check)



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