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MMRF2007N bảng dữ liệu(PDF) 3 Page - NXP Semiconductors |
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MMRF2007N bảng dữ liệu(HTML) 3 Page - NXP Semiconductors |
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3 / 17 page ![]() MMRF2007N MMRF2007GN 3 RF Device Data Freescale Semiconductor, Inc. Table 5. Electrical Characteristics (TA =25C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Stage 2 — Off Characteristics (1) Zero Gate Voltage Drain Leakage Current (VDS =70 Vdc, VGS =0 Vdc) IDSS — — 10 Adc Zero Gate Voltage Drain Leakage Current (VDS =28 Vdc, VGS =0 Vdc) IDSS — — 1 Adc Gate--Source Leakage Current (VGS =1.5 Vdc, VDS =0 Vdc) IGSS — — 1 Adc Stage 2 — On Characteristics (1) Gate Threshold Voltage (VDS =10 Vdc, ID = 320 Adc) VGS(th) 1.2 2.0 2.7 Vdc Gate Quiescent Voltage (VDS =25 Vdc, IDQ2(A+B) = 550 mAdc) VGS(Q) — 3.1 — Vdc Fixture Gate Quiescent Voltage (VDD2 =25 Vdc, IDQ2(A+B) = 550 mAdc, Measured in Functional Test) VGG(Q) 7.6 8.6 9.6 Vdc Drain--Source On--Voltage (VGS =10 Vdc, ID =3.2 Adc) VDS(on) 0.1 0.48 1.2 Vdc Functional Tests (1,2,3) (In Freescale Test Fixture, 50 ohm system) VDD1 =28 Vdc, VDD2 =25 Vdc, IDQ1(A+B) =60 mA, IDQ2(A+B) = 550 mA, Pout = 35 W Avg., f1 = 939.9 MHz, f2 = 940.1 MHz Power Gain Gps 31.5 32.6 36.5 dB Power Added Efficiency PAE 40.5 42.1 — % Intermodulation Distortion IMD — –31.3 –29.0 dBc Typical Performance (1) (In Freescale Test Fixture, 50 ohm system) VDD1 =28 Vdc, VDD2 =25 Vdc, IDQ1(A+B) =60 mA, IDQ2(A+B) = 550 mA, 850–940 MHz Bandwidth Characteristic Symbol Min Typ Max Unit Pout @ 1 dB Compression Point, CW P1dB — 79 — W IMD Symmetry @ 71 W PEP, Pout where IMD Third Order Intermodulation 30 dBc (Delta IMD Third Order Intermodulation between Upper and Lower Sidebands > 2 dB) IMDsym — 22 — MHz VBW Resonance Point (IMD Third Order Intermodulation Inflection Point) VBWres — 50 — MHz Quiescent Current Accuracy over Temperature Stage 1 with 8.25 k Gate Feed Resistors (–30 to 85C) (4) Stage 2 IQT — — 5.03 4.61 — — % Gain Flatness in 90 MHz Bandwidth @ Pout =35 W Avg. GF — 1.2 — dB Gain Variation over Temperature (–30Cto+85C) G — 0.03 — dB/C Output Power Variation over Temperature (–30Cto+85C) P1dB — 0.005 — dB/C Table 6. Ordering Information Device Tape and Reel Information Package MMRF2007NR1 R1 Suffix = 500 Units, 44 mm Tape Width, 13--inch Reel TO--270WBL--16 MMRF2007GNR1 TO--270WBLG--16 1. Side A and Side B are tied together for this measurement. 2. Part internally matched both on input and output. 3. Measurements made with device in straight lead configuration before any lead forming operation is applied. Lead forming is used for gull wing (GN) parts. 4. Refer to AN1977, Quiescent Current Thermal Tracking Circuit in the RF Integrated Circuit Family, and to AN1987, Quiescent Current Control for the RF Integrated Circuit Device Family. Go to http://www.freescale.com/rf and search for AN1977 or AN1987. |
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