LTM4651 datasheet(5/34 Pages) LINER

5 / 34 page

LTM4651

4651f

For more information www.linear.com/LTM4651

The l denotes the specifications which apply over the specified internal

operating temperature range (Note 2). TA = 25°C, Test Circuit 1, VIN = 24V and electrically connected to SVIN and RUN, ISETa – SVOUT– =

24V, EXTVCC = PGND, CLKIN open circuit, RfSET = 57.6kΩ and RISET = 480kΩ and voltages referred to PGND unless otherwise noted.

Note 1: Stresses beyond those listing under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating conditions for extended periods may affect device

reliability and lifetime.

Note 2: The LTM4651 is tested under pulsed load conditions such that

TJ ≈ TA. The LTM4651E is guaranteed to meet performance specifications

over the 0°C to 125°C internal operating temperature range. Specifications

over the full –40°C to 125°C internal operating temperature range are

assured by design, characterization and correlation with statistical process

controls. The LTM4651I is guaranteed to meet specifications over the full

internal operating temperature range. Note that the maximum ambient

temperature consistent with these specifications is determined by specific

operating conditions in conjunction with board layout, the rated package

thermal resistance and other environmental factors.

Note 3: See output current derating curves for different VIN, VOUT, and TA,

located in the Applications Information section.

Note 4: Minimum on-time, VIN Overvoltage Lockout and Overvoltage

Lockout Hysteresis, PGOOD Delay, and EXTVCC Switchover Threshold are

tested at wafer sort.

Note 5: VOUT(–0.5VDC)– low line regulation is tested at 3.6VIN, with fSET and

CLKIN open circuit. High line regulation is tested at 28VIN, and with CLKIN

driven at 200kHz—so as to ensure minimum on time criteria is met. The

LTM4651 is not recommended for applications where the minimum on-

time criteria (guardband to 90ns) is continuously violated. The LTM4651

can ride through events (such as VIN surge) where the on-time criteria is

transiently violated. See the Applications Information section.

Note 6: VOUT(–24VDC)– is tested at 3.6VIN and 34VIN, with CLKIN driven

with a 1.8MHz clock, ISETa – SVOUT– = 24V, and RfSET = 57.6kΩ. It is also

tested at 24VIN, with CLKIN driven with a 1.5MHz clock, RfSET = 57.6kΩ,

and RISET = 480kΩ.

Note 7: This IC includes overtemperature protection that is intended

to protect the device during momentary overload conditions. Junction

temperature will exceed 125°C when overtemperature protection is active.

Continuous operation above the specified maximum operating junction

temperature may impair device reliability.

Note 8: The INTVCC Abs Max peak output current is specified as the sum

of current drawn by circuits internal to the module biased off of INTVCC

and current drawn by external circuits biased off of INTVCC. See the

Applications Information section.

SYMBOL

PARAMETER

CONDITIONS

MIN

TYP

MAX UNITS

Input Voltage Regulation Pin

VVINREG

VINREG Servo Voltage

VINREG Voltage During Output Current Regulation,

Measured with Respect to SVOUT–

1.8

2.0

2.2

IVINREG

VINREG Leakage Current

VINREG – SVOUT– = 2V

INTVCC Regulator

VINTVCC

Channel Internal VCC Voltage, No

INTVCC Loading (IINTVCC = 0mA)

3.6V ≤ SVIN – SVOUT– ≤ 58V, EXTVCC = Open Circuit

5V ≤ SVIN – SVOUT– ≤ 58V, 3.2V ≤ EXTVCC – VOUT– ≤ 26.5V

(INTVCC Measured with Respect to VOUT–)

3.15

2.85

3.4

3.0

3.65

3.15

VEXTVCC(TH)

EXTVCC Switchover Voltage

(Note 4)

3.15

∆VINTVCC(LOAD)/

VINTVCC

INTVCC Load Regulation

0mA ≤ IINTVCC ≤ 30mA

–2

0.5

Temperature Sensor

∆VTEMP

Temperature Sensor Forward Voltage,

VTEMP+ – VTEMP–

ITEMP+ = 100µA and ITEMP– = –100μA at TA = 25°C

0.6

TC∆V(TEMP)

∆VTEMP Temperature Coefficient

–2.0

mV/°C

ELECTRICAL CHARACTERISTICS

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