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S25FL032P bảng dữ liệu(PDF) 50 Page - Cypress Semiconductor |
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S25FL032P bảng dữ liệu(HTML) 50 Page - Cypress Semiconductor |
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50 / 60 page ![]() Document Number: 002-00650 Rev. *L Page 50 of 60 S25FL032P Notes 1. Typical program and erase times assume the following conditions: 25°C, VCC = 3.0 V; 10,000 cycles; checkerboard data pattern. 2. Under worst-case conditions of 85°C; VCC = 2.7 V; 100,000 cycles. 3. Acceleration mode (9 V ACC) only in Program mode, not Erase. 4. Only applicable as a constraint for WRR instruction when SRWD is set to a ‘1’. 5. tWH + tWL must be less than or equal to 1/fC. 6. Full Vcc range (2.7 – 3.6 V) & CL = 30 pF. 7. Regulated Vcc range (3.0 – 3.6 V) & CL = 30 pF. 8. Regulated Vcc range (3.0 – 3.6 V) & CL = 15 pF. 18.1 Capacitance Notes 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz. 3. For more information on pin capacitance, please consult the IBIS models. Figure 45. SPI Mode 0 (0,0) Input Timing tSE Sector Erase Time (64 KB) (1)(2) 0.5 2 sec tPE Parameter Sector Erase Time (1)(2) (4 KB or 8 KB) 200 800 ms tBE Bulk Erase Time (1)(2) 32 64 sec tRES Deep Power-down to Standby Mode 30 µs tDP Time to enter Deep Power-down Mode 10 µs tVHH ACC Voltage Rise and Fall time 2.2 µs tWC ACC at VHH and VIL or VIH to first command 5 µs Table 25. AC Characteristics (Continued) Symbol (Notes) Parameter (Notes) Min. (Notes) Typ (Notes) Max (Notes) Unit Symbol Parameter Test Conditions Min Typ Max Unit CIN Input Capacitance (applies to SCK, PO7-PO0, SI, CS#) VOUT = 0 V 9.0 12.0 pF COUT Output Capacitance (applies to PO7-PO0, SO) VIN = 0 V 12.0 16.0 pF CS# SCK SI SO tCSH tCSS tCSH tCSS tCFT tCRT MSB IN LSB IN Hi-Z tSU:DAT tHD:DAT tCS |
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