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CAT93HC46 bảng dữ liệu(PDF) 3 Page - Catalyst Semiconductor

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CAT93HC46 bảng dữ liệu(HTML) 3 Page - Catalyst Semiconductor

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CAT93HC46
Doc. No. 1008, Rev. G
1.8 V - 5.5 V
2.5 V - 5.5 V
4.5 V - 5.5 V
Test
Symbol
Parameter
Min
Max
Min
Max
Min
Max
Units
Conditions
SKMAX
Maximum Clock Frequency
DC
1
DC
2
DC
4
MHz
tCSS
CS Setup Time
240
120
60
ns
tCSH
CS Hold Time
0
0
0
ns
tDIS
DI Setup Time
240
120
60
ns
tDIH
DI Hold Time
240
120
60
ns
tPD1
Output Delay to 1
480
240
120
ns
tPD0
Output Delay to 0
480
240
120
ns
tHZ(1)
Output Delay to High-Z
240
120
60
ns
tCSMIN
Minimum CS Low Time
240
120
60
ns
tSKHI
Minimum SK High Time
480
240
120
ns
tSKLOW
Minimum SK Low Time
240
120
60
ns
tSV
Output Delay to Status Valid
480
240
120
ns
tEW
Program/Erase Pulse Width
5
5
5
ms
A.C. TEST CONDITIONS
Input Rise and Fall Times
≤ 10 ns
Input Pulse Voltages
0.4 V to 2.4 V
4.5 V
≤ VCC ≤ 5.5 V
Timing Reference Voltages
0.8 V, 2.0 V
4.5 V
≤ VCC ≤ 5.5 V
Input Pulse Voltages
VCC x 0.2 to VCC x 0.8
1.8 V
≤ VCC ≤ 4.5 V
Timing Reference Voltages
VCC x 0.5
1.8 V
≤ VCC ≤ 4.5 V
POWER-UP TIMING (1)(2)
Symbol
Parameter
Min
Typ
Max
Units
tPUR
Power-up to Read Operation
1
ms
tPUW
Power-up to Write Operation
1
ms
NOTE:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated.
(3) The input levels and timing reference points are shown in the “AC Test Conditions” table.
A.C. CHARACTERISTICS
Industrial Temperature Range (-40
°C to 85°C)
CL = 100 pF
(3)



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