WM8734

Advanced Information

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AI Rev 2.2 November 2001

4

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at

or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified.

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible

to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage

of this device.

CONDITION

MIN

MAX

Digital supply voltage

-0.3V

+3.63V

Analogue supply voltage

-0.3V

+3.63V

Voltage range digital inputs

DGND -0.3V

DVDD +0.3V

Voltage range analogue inputs

AGND -0.3V

AVDD +0.3V

Master Clock Frequency (see Note 4)

40MHz

-10

°C

+70

°C

Storage temperature prior to soldering

30

°C max / 85% RH max

Storage temperature after soldering

-65

°C

+150

°C

Package body temperature (soldering 10 seconds)

+240

°C

Package body temperature (soldering 2 minutes)

+183

°C

Notes:

1.

Analogue and digital grounds must always be within 0.3V of each other.

2.

The digital supply core voltage (DCVDD) must always be less than or equal to the analogue supply voltage (AVDD) or

digital supply buffer voltage (DBVDD).

3.

The digital supply buffer voltage (DBVDD) must always be less than or equal to the analogue supply voltage (AVDD).

4.

When CLKIDIV2=1.

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Digital supply range (Core)

DCVDD

2.7

3.3

3.6

V

Digital supply range (Buffer)

DBVDD

2.7

3.3

3.6

V

Analogue supply range

AVDD

2.7

3.3

3.6

V

Ground

DGND, AGND

0

V

Total analogue supply current

IAVDD

DCVDD, DBVDD,

AVDD = 3.3V

16

mA

Digital supply current

IDCVDD, IDBVDD

DCVDD, DBVDD

AVDD = 3.3V

8

mA

Standby Current Consumption

5

uA