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RT5070GSP bảng dữ liệu(PDF) 5 Page - Richtek Technology Corporation |
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RT5070GSP bảng dữ liệu(HTML) 5 Page - Richtek Technology Corporation |
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5 / 13 page ![]() RT5070 Copyright © 2016 Richtek Technology Corporation. All rights reserved. is a registered trademark of Richtek Technology Corporation. DS5070-01 November 2016 www.richtek.com 5 Parameter Symbol Test Conditions Min Typ Max Unit VOUT = 18.3V, IOUT = 50mA to 450mA -- 45 90 Line Regulation VOUT_LINE VIN = 9 to 14V, VOUT = 13.3V, IOUT = 50mA 10 -- 10 mV VIN = 9 to 14V, VOUT = 18.3V, IOUT = 50mA 10 -- 10 Protection Output Over-Current Limit ILIM_LNB1 VLNB = 13.3V/18.3V 500 550 650 mA Output Over-Current Disable Time TDIS_ON VLNB short to GND -- 45 -- ms Output Over-Current Disable Time TDIS_OFF VLNB short to GND (GBD) -- 1800 -- ms VIN Under-Voltage Lockout Threshold VUVLO VIN falling -- 7.35 -- V VIN Turn On Threshold VIN_TH VIN rising -- 7.7 8 V VIN Under-Voltage Lockout Hysteresis VUVLOHYS -- 350 -- mV OTP Threshold TOTP -- 140 -- oC OTP Hysteresis TOTPHYS -- 15 -- oC ENABLE, SEL Pins EN Logic Input VEN_H 1.2 -- -- V VEN_L -- -- 0.4 EN Input Leakage IENLKG -- 5 10 A SEL Logic Input VSEL_H 1.2 -- -- V VSEL_L -- -- 0.4 SEL Input Leakage ISELLKG -- 5 10 A Note 1. Stresses beyond those listed “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may affect device reliability. Note 2. JA is measured at TA = 25C on a high effective thermal conductivity four-layer test board per JEDEC 51-7. JC is measured at the exposed pad of the package. Note 3. Devices are ESD sensitive. Handling precaution recommended. Note 4. The device is not guaranteed to function outside its operating conditions. Note 5. Operation at VIN = 16V may be limited by power loss in the linear regulator. |
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