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TSX9292 bảng dữ liệu(PDF) 21 Page - STMicroelectronics

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TSX9291, TSX9292
Application information
31
Equation 5
To evaluate the op-amp reliability, a follower stress condition is used where VCC is defined
as a function of the maximum operating voltage and the absolute maximum rating (as
recommended by JEDEC rules).
The Vio drift (in µV) of the product after 1000 h of stress is tracked with parameters at
different measurement conditions (see Equation 6).
Equation 6
The long-term drift parameter (ΔVio), estimating the reliability performance of the product, is
obtained using the ratio of the Vio (input offset voltage value) drift over the square root of the
calculated number of months (Equation 7).
Equation 7
where Vio drift is the measured drift value in the specified test conditions after 1000 h stress
duration.
4.7
Capacitive load
Driving a large capacitive load can cause stability issues. Increasing the load capacitance
produces gain peaking in the frequency response, with overshooting and ringing in the step
response. It is usually considered that with a gain peaking higher than 2.3 dB the op-amp
might become unstable. Generally, the unity gain configuration is the worst configuration for
stability and the ability to drive large capacitive loads. Figure 39 shows the serial resistor
(Riso) that must be added to the output, to make the system stable. Figure 40 shows the
test configuration for Riso.
Months
AF 1000 h
×
12 months
24 h
365.25 days
×
()
×
=
VCC
maxVop with Vicm
VCC 2
==
ΔVio
Viodrift
months
()
------------------------------
=



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