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ALD810021 bảng dữ liệu(PDF) 2 Page - Advanced Linear Devices

tên linh kiện ALD810021
Giải thích chi tiết về linh kiện  SUPERCAPACITOR AUTO BALANCING (SAB) MOSFET ARRAYS
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nhà sản xuất  ALD [Advanced Linear Devices]
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ALD8100XX/ALD9100XX SUPERCAPACITOR
Advanced Linear Devices, Inc.
2 of 17
AUTO BALANCING (SAB) MOSFET ARRAY FAMILY
balancing generally contribute additional continuous power dissi-
pation due to linear currents at all supercapacitor voltage levels,
whereas SAB MOSFET leakages decrease exponentially with de-
creased supercapacitor voltages. In many cases, the additional
leakage charge loss is near zero.
UNDERSTANDING SUPERCAPACITOR AUTO BALANCING
USING SAB™ MOSFETS
The principle behind the SAB MOSFET in balancing
supercapacitors is simple. It is based on the natural threshold char-
acteristics of a MOSFET device. The threshold voltage of a
MOSFET is the voltage at which a MOSFET turns on and starts to
conduct a current. The drain current of the MOSFET, at or below
its threshold voltage, is an exponential function of its gate voltage.
Hence, for small changes in the MOSFET’s gate voltage, its drain-
source on-current can vary greatly, by orders of magnitude. ALD’s
SAB MOSFETs are designed to take advantage of this fundamen-
tal device characteristic.
SAB MOSFETs are connected in the Vt mode, meaning that the
Gate-to-Source and the Drain-to-Source terminals of each MOSFET
are always connected. In this mode VGS is always equal to VDS
and when this joint terminal is connected across a supercapacitor,
it is also referred to as an Input Voltage, VIN. Each SAB MOSFET
has a well defined Drain-to-Source Current, IDS(ON), for different
values of VIN Voltages. This current is also referred to as the Out-
put Current, IOUT, of the SAB MOSFET.
SAB MOSFETs can be connected in parallel or in series, to suit the
desired leakage current characteristics, in order to charge-balance
an array of supercapacitors connected in series. The array of com-
bined SAB MOSFETs and supercapacitors would be automatically
self-regulating with various leakage mismatches and environmen-
tal temperature changes. The SAB MOSFETs can also be used
entirely in the subthreshold mode, meaning the SAB MOSFET is
used at min., nominal and max. operating voltages in voltage ranges
below its specified threshold voltage.
With the ALD8100xx/ALD9100xx family, the threshold voltage Vt
of an SAB MOSFET is defined as its drain-gate source voltage at a
drain-source ON current, IDS(ON) = 1µA, when its gate and drain
terminals are connected together (VGS = VDS). This voltage is
specified as xx, where the threshold voltage is in 0.10V increments.
Two examples are: the ALD810025 features a precise threshold
voltage of Vt = 2.500V at IDS(ON) = 1µA and the AL ºD810017 has
Vt = 1.700V at IDS(ON) = 1µA.
As all ALD8100xx/ALD9100xx devices operate similarly, with lin-
ear voltage shifts, an ALD810025 is used as an illustration of its
characteristics. At voltages below its threshold voltage, the
ALD810025 rapidly turns off at a rate of approximately one decade
of current per 104mV of voltage drop. Hence, at VIN = 2.396V, the
ALD810025 IOUT is 0.1µA. At VIN = 2.292V, its IOUT becomes
0.01µA. When VIN drops further to 2.188V, its IOUT becomes
0.001µA. It should be apparent that at VIN ≤ 2.10V, the ALD810025
IOUT ≤ 0.00014µA, which is near zero when compared to 1µA at
VIN = 2.50V. At VIN below 1.9V, the SAB MOSFET Output Current,
IOUT, goes to essentially zero (~70pA). The IOUT ≤ 0.00014µA is
controlled and repeatable for different units from various produc-
tion batches.
This exponential relationship between the SAB MOSFET’s VIN and
IOUT can be an important consideration in replacing certain
supercapacitor charge balancing applications currently using fixed
resistors, operational amplifier circuits or other forms of charge bal-
ancing. These other conventional charge-balancing methods con-
tinue to dissipate a significant amount of current, even after the
voltage across the supercapacitors has dropped, because the cur-
rent dissipated is a linear function, rather than an exponential func-
tion, of the supercapacitor voltage (I = V/R). For supercapacitor
series stacks with more than two cells, the challenge of leakage
balancing becomes even more onerous.
With most other passive or active circuits that offer charge balanc-
ing, active power is still being consumed even if the supercapacitor
voltage falls much below its operating voltage. For a four-cell
supercapacitor stack, for example, this translates into a 2.0V x 4
~= 8.0V power supply for an IC charge-balancing circuit. As the
number of cells increase, adding components to the charge bal-
ancing circuit, increased circuit complexity and power dissipation
becomes a greater challenge. A supercapacitor stack using the SAB
MOSFET charge-balancing method, on the other hand, would not
cause extra power dissipation when the number of cells increase.
This method provides an exponentially decreasing amount of charge
loss with time, and helps preserve, by far, the greatest amount of
charge on each of the supercapacitors.
If VIN of the ALD810025 is greater than its Vt threshold voltage, its
Output Current, IOUT, behavior has the opposite near-exponential
effect. At VIN = 2.60V, for example, the ALD810025 IOUT increases
tenfold to 10µA. Similarly, IOUT becomes 100µA at a VIN of 2.74V,
and 300µA at VIN of 2.84V. (See Table 1.)
As IOUT changes rapidly with the applied VIN, the SAB MOSFET
device acts like a voltage limiting regulator with self-adjusting cur-
rent levels. When the SAB MOSFET is connected across a
supercapacitor cell, the total leakage current equals the two in com-
bination automatically compensate and correct for each other.
Consider the case when two supercapacitor cells are connected in
series, each with an SAB MOSFET connected across it, charged
by a power supply to a voltage equal to 2 x VS.
If the top supercapacitor has a higher internal leakage current than
the bottom supercapacitor, the voltage VS(top) across it tends to
drop lower than that of the bottom supercapacitor. The SAB
MOSFET IOUT across the top supercapacitor, sensing this voltage
drop, drops off rapidly. Meanwhile, the bottom supercapacitor
VS(bottom) voltage tends to rise, as VS(bottom) = (2 x VS) - VS(top).
This tendency for the voltage rise also increases VIN voltage of the
SAB MOSFET across the bottom supercapacitor. This increased
VIN voltage would cause the IOUT of the bottom SAB MOSFET to
increase rapidly as well. The excess leakage current of the top
supercapacitor would now leak across the bottom SAB MOSFET,
reducing the voltage rise tendency of the lower supercapacitor. With
this automatic self-regulating mechanism, the top supercapacitor
voltage tends to rise while the bottom supercapacitor voltage tends
to drop, creating simultaneously opposing actions to the
supercapacitor leakage currents.
With appropriate design and selection of a specific SAB MOSFET
device for a given pair of supercapacitors, it is now possible to
regulate and balance two series-connected supercapacitors with
essentially no extra leakage current, since the SAB MOSFET only
conducts the difference in leakage current between the two
supercapacitors.
Likewise, the case of the bottom supercapacitor having a higher
leakage current than that of the top supercapacitor works in similar
fashion, where the bottom supercapacitor voltage tends to drop,
compensated by the tendency of the top supercap voltage to drop
as well, effected by the top SAB MOSFET. This SAB MOSFET
charge balancing scheme also works with four, eight or more
supercapacitors in series by using an equivalent number of SAB
MOSFETs in multiple package(s).
Ambient temperature increases cause supercapacitor leakage cur-
rents to increase. The SAB MOSFET threshold voltage is reduced
ALD8100XX/ALD9100XX FAMILY GENERAL DESCRIPTION (cont.)



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